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Boundary Scan Controller with Wireless LAN Interface   

Goepel-SFX WSL 114929 October 2012 - GOEPEL electronic introduced the SFX/WSL1149-(x), the world’s first controllers for Wireless LAN (WLAN) as an addition to the company’s Boundary Scan hardware platform SCANFLEX. The new Boundary Scan controller series provides a Triple Stream/Dual Band WLAN interface for theoretical transmission speed up to 450 Mbps, enabling wireless utilization of the newest Embedded System Access (ESA) technologies for testing, programming and debugging of complex chips, boards, and entire systems.

The SFX/WSL1149-(x) controller series is the world’s first with integrated WLAN control, compatible with IEEE standard 802.11a/b/g/n. Additionally, the module provides USB2.0 and Gbit Ethernet interfaces.

The controller series includes three models of different performance classes to be configured by software, enabling TCK frequencies of up to 80 MHz. In combination with additional components of the modular SCANFLEX product range, such as the SCANFLEX TAP Transceiver (SFX Transceiver) and SCANFLEX I/O modules (SFX Modules), WLAN controlled Boundary Scan systems can be configured with up to eight independent parallel TAPs and up to 31 additional analogue or digital functional modules. The wireless operation greatly simplifies handling, providing benefits for remote test, debug and fault diagnosis applications. On this basis, the SFX/WSL1149-(x) is able to support all technologies for Embedded System Access. 

The SFX/WSL1149-(x) controller series will be fully supported in the JTAG/Boundary Scan software platform SYSTEM CASCON starting from version 4.6.2.

“Our goal of continuously expanding the market leadership by our unrivalled Boundary Scan hardware platform SCANFLEX is impressively demonstrated by the new controller on WLAN basis”, says Thomas Wenzel, Managing Director of GOEPEL electronic’s JTAG/Boundary Scan division. “The wireless communication enables considerably more flexible process integration for operations such as remote debugging, centralized control of distributed test and programming systems, or resource splitting between several users in the lab as well as in the production process.”

Boundary Scan (IEEE Std. 1149.x) is a technology for embedded access of IC pins by way of integrated scan cells. They form a shift register controlled via the Test Access Port (TAP). The principle was developed as an alternative to In-Circuit Test (ICT) to avoid the utilization of nail probe contact.

Boundary Scan is part of the so called Embedded System Access (ESA) technologies, containing procedures such as Chip Embedded Instruments, Processor Emulation Test, In-System Programming or Core Assisted Programming. ESA technologies are currently the most modern strategies for validation, test and debug as well as programming of complex boards and systems. They can be applied throughout the entire product life cycle, enabling enhanced test coverage at reduced costs.

www.goepel.com


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