This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  

Newsletter

Register to our newsletter
Every two weeks -
all news at a glance
captcha 

Latest Test and Measurement News

Combination of Boundary Scan Test and analogue Opens/Shorts Test

12 April 2011 - GOEPEL electronic introduced the TIC02/PMU, another TAP Interface Card (TIC) within the frame of the technologically leading JTAG/Boundary Scan hardware platform SCANFLEX. The new module enables the test of peripheral networks in particular for shorts and open connections without powering up the UUT. Using this option, dangerous solder faults can be detected before possibly leading to latent or permanent damages of the integrated circuit when operation voltage is switched on.

“The new hardware option is our reaction to the specific requirements in mission critical applications due to calculated reliability, standardised test quality and process risk minimisation,“ says Stefan Meissner, GOEPEL electronics’ Marketing and PR Manager. “In combination with the relevant software tools, users are now able to develop analogue opens/shorts tests fast and efficiently, enhancing modern test methods such as Boundary Scan, processor emulation test or chip embedded instruments. At the same time, we extend the leading position of our unique hardware platform SCANFLEX.”

The TIC02/PMU module is pin compliant to the already existing TAP Interface Card TIC02 and additionally features a powerless measurement unit (PMU). In test cases the PMU is interposed as signal source to the UUT’s native operation voltage connections, enabling opens/shorts test of the contacted nets in connection with externally switched I/O channels. A Multitude of parallel SCANFLEX I/O modules, e.g. SFX 5296 or PXI 52192 can be utilised as I/O channels.

TIC02/PMU is designed for direct build-in into a UUT fixture and can be connected to any TAP slot of a SCANFLEX TAP Transceiver at distances of several meters. In the Boundary Scan mode the hardware works as normal TAP interface. It enables an extremely simple and backwards-compatible migration to the analogue opens/shorts test method.

The new TAP Interface Card is fully supported by the industrially leading JTAG/Boundary Scan software platform SYSTEM CASCON™ from version 4.5.4 onwards. It also includes a Test Generator that recognises connected I/O test channels and generates parametric control sequences for the TIC02/PMU.

www.goepel.com


Related Articles:

No related articles found


Upcoming Events

Control 2024
Stuttgart (Germany)
23 to 26 April
Automotive Testing Expo Europe 2024
Stuttgart (Germany)
04 to 06 June
PCIM 2024
Nuremberg (Germany)
11 to 13 June

  More events...
  See our Trade Show Calendar
  Click here

 

Advertising
Advertising