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Test Solution for 10 Mb/s In-Vehicle Designs

18 November 2022 – Teledyne LeCroy announced the addition of a CAN XL Trigger, Decode, Measure/Graph and Eye Diagram (TDME) oscilloscope software option, enabling users to test, validate and debug automotive electronic control units (ECUs) and 10 Mb/s in-vehicle network (IVN) designs. This new CAN-XL oscilloscope option positions Teledyne LeCroy as the only vendor to offer complete capabilities for testing any 10 Mb/s in-vehicle network.

Today’s vehicles can contain more than 100 ECUs connected by an IVN that uses serial data signals to transmit information. Many factors are increasing the demand for more data capacity in the IVN: data from radar, lidar, cameras and other sensors used for autonomous driving technologies; the trend towards vehicle electrification, which uses the network to operate distributed systems; and the emergence of connected vehicle technologies to improve safety, system efficiency and mobility, among others. In response, vehicle manufacturers are adapting existing, domain-based IVN architectures to operate at higher speeds.

For instance, Controller Area Network (CAN) at 500 kb/s and CAN Flexible Data-rate (CAN FD) at 2 Mb/s have been updated to operate at 10 Mb/s, the CAN XL specified rate. Longer term, the new zonal IVN architectures, primarily using 10Base-T1S, will improve cost and reliability of IVNs. Support for both CAN XL and 10Base-T1S standards in oscilloscopes will be critical to automakers as they implement CAN XL in existing vehicles while designing newer and premium vehicles that utilize 10Base-T1S.

Teledyne LeCroy’s CAN XL TDME option, combined with the recently launched 10Base-T1S TDME option, gives vehicle ECU designers unparalleled flexibility to test, validate and debug 10 Mb/s serial data IVN designs. Only Teledyne LeCroy has support for both these standards. Teledyne LeCroy has supported IVN testing since 2004 with the release of the first CAN trigger and decode option and now offers more than 25 different solutions for IVN testing, ranging from 10 kb/s to 10 Gb/s. There are options for serial data debug, electrical compliance testing, and impedance profile and s-parameter serial data link analysis.

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