|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement NewsAgilent Technologies Expands Signal Analyzer Portfolio17 September 2010 - Agilent Technologies Inc. introduced eight new measurement applications for its PXA X-Series signal analyzer. The measurement applications cover a range of industry standards in cellular communication, wireless networking, digital video and other general purpose applications. In addition, three new measurement applications have been added to Agilent's MXA and EXA signal analyzers portfolio and the LTE FDD, LTE TDD and EDGE Evolution applications have been updated. The new measurement applications are used in R&D, design validation and production to ease the burden of physical layer testing for 3G/3.5G/3.9G cellular, wireless and digital video applications, and RF testing for general-purpose applications.
The new X-Series applications for the PXA include:
Measurement Applications for EXA/MXA New measurement applications for EXA and MXA include Bluetooth, SCPI language compatibility and an external source control option.
The updated LTE FDD and TDD measurement applications now feature:
The updated EDGE Evolution measurement application now supports new capabilities being defined in Release 9 of the 3GPP GERAN standards. These capabilities include voice services over adaptive multiuser channels on one slot (VAMOS), an evolution of GSM for doubling GSM voice capacity, and multicarrier GSM (also known as MC-BTS). To date, the X-Series are the only signal analyzers offering support for both MC-BTS and VAMOS. All of the new and updated measurement applications use a hardkey/softkey manual user interface plus SCPI programming capabilities. This is particularly beneficial in automated testing, such as during design validation and manufacturing.
X-Series Measurement Applications The new and enhanced measurement applications are part of a common library of more than 22 advanced measurement applications within the Agilent X-Series family. The X-Series analyzers use an evolutionary approach to signal analysis that spans instrumentation, measurements and software. The X-Series analyzers; with an upgradeable CPU, memory, disk drives and I/O ports; enable engineers to keep their test assets current and extend instrument longevity. Proven algorithms, 100 percent code-compatibility and a common user interface across the X-Series create a consistent measurement framework for signal analysis. This ensures repeatable results and measurement integrity, making it possible for engineers to leverage their test system software through all phases of product development. Engineers can further extend their test assets by transporting applications across multiple X-Series analyzers. The new measurement applications for the X-Series signal analyzers will be available for download in September. www.agilent.com/find/X-Series_NewAppsRelated Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |