|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
![]() Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
![]() Readers Top 5 News of last 30 days
Latest Test and Measurement NewsRemote Control Solution for PXI Systems with Thunderbolt 3
With its modern connectivity and low price point, the PXIe-8301 makes high-performance control of PXI systems more accessible and affordable to engineers performing benchtop characterization and validation or developing portable automated test systems. “The PXI platform has seen strong adoption with vendors and customers over the past 20 years in a broad set of applications,” said Mark Wetzel, distinguished engineer at NI and technical chair of PXI Systems Alliance. “The introduction of a remote control module using Thunderbolt 3 demonstrates the continued ability of the PXI platform to incorporate the latest commercial technologies and further its reach into high-performance, low-cost and ultraportable applications.” The PXIe-8301 extends NI’s portfolio for low-cost PXI control, which includes the recently released embedded PXI Controller, the PXIe-8821. The PXIe-8821 is optimized for test and measurement applications, featuring a 2.6 GHz Intel Core i3-4110E dual-core processor and providing up to 2 GB/s system bandwidth. With their industrial ratings, small physical footprint and managed life cycles, embedded controllers are ideal for long-life PXI deployments into harsh operating environments. Remote control modules and embedded controllers are an important part of the NI platform and ecosystem that engineers can use to build smarter test systems. These test systems benefit from more than 600 PXI products ranging from DC to mmWave and feature high-throughput data movement using PCI Express bus interfaces and sub-nanosecond synchronization with integrated timing and triggering. Supported by a vibrant ecosystem of partners, add-on IP and applications engineers, the NI platform helps to dramatically lower the cost of test, reduce time to market and future-proof testers for tomorrow’s challenging requirements. www.ni.com/ Related Articles: |
![]() Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |