Stable and high parallel Handling Solutions for various Applications

15 June 2012 - Multitest, a designer and manufacturer of final test handlers, contactors and load boards, announces that its InCarrier Loader/Unloader is available in a variety of configurations, e.g. for loading from tube, bowl, tray and for unloading into tube, bulk or metal mag in any combination. Additionally, partner solutions for loading from wafer ring or unloading into tape-and-reel can be offered.

The Multitest InCarrier is a unique test handling solution that combines the substantial advantages of the strip handling process with the advantages of the standard test handling process. The concept of the InCarrier consists of a tray/carrier, into which singulated ICs are loaded to be tested in the InStrip, Multitest’s high parallel strip test handler. Finally the tested ICs are unloaded into the final packaging and shipping medium. Multitest offers the InCarrier Loader/Unloader tool for these processes.

The InCarrier is a unique solution for stable and high parallel test handling of semiconductors and sensors in the smallest packages down to 1.2 x 1.2 mm.

The InCarrier process already has been established at high-volume customer sites in Europe, USA and Asia for both automotive and consumer applications.