This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  

Newsletter

Register to our newsletter
Every two weeks -
all news at a glance
captcha 

Latest Test and Measurement News

Testing of High-Res Audio ICs

Advantest GPWGD16 May 2019 - Advantest introduced its GPWGD high-resolution module featuring the industry’s highest analog-performance digitizer, which supports testing of high-resolution audio digital-to-analog converters (DACs) embedded in power-management ICs (PMICs) as well as stand-alone high-resolution audio devices.

The module’s innovative measurement technique performs over an ultra-high dynamic range, achieving unprecedented accuracy in analog testing from device characterization to mass production without requiring complex performance boards or additional test and measurement instruments on the T2000 test platform.

High-resolution audio features both a wider dynamic range and an improved sound source compared to CDs. The proliferation of electronic devices capable of supporting high-resolution audio – including smart phones, wireless audio components for wearable electronics and home theaters, automotive navigation systems, gaming consoles, 4K and 8K televisions, and other next-generation products – has led to an increase in the number of PMICs with embedded digital-to-analog converters (DACs), which require high-dynamic-range testing with 24-bit or 32-bit resolution.

When used on the T2000 platform, the GPWGD high-resolution module provides the versatility to test both PMICs and high-resolution audio DACs using the same system configuration. This helps users to save on their capital investments while also reducing test cycle times.

The module’s upward compatibility and the high-resolution functionality of its digitizer enable industry-leading measurements with both a signal-to-noise ratio (SNR) and a dynamic range (DR) of 130 dB, surpassing the analog performance of other testers typically used by developers of audio ICs. In addition, the unit’s massive parallel site testing capability leverages twice the number of sites compared to other systems on the market, resulting in higher throughput and a lower cost of test.

The new GPWGD high-resolution module’s extendible design allows it to be seamlessly integrated into either laboratory or production environments for existing device types as well as new high-resolution audio ICs.

www.advantest.com/



Related Articles:

Upcoming Events

EPE '19 ECCE
Genova (Italy)
02 to 05 September 2019
What's New in Electronics 2019
NAEC Stoneleigh (UK)
18  to 19 September 2019
Smart Systems Integration 2020
Grenoble (France)
01 to 02 April 2020
Advertising
Advertising

Social Media

twitter_follow_420x50px