This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  

Newsletter

Register to our newsletter
Every two weeks -
all news at a glance
captcha 

Latest Test and Measurement News

High Density Source Measure Unit for Semiconductor Characterization

Keysight PZ2100A14 July 2023 - Keysight Technologies introduced the PZ2100 Series High-Channel Density Precision Source Measure Unit (SMU) Solution, a new SMU solution giving digital development engineers 20 precision SMU channels within a 1U rack space to speed the characterization of integrated circuit (IC) designs. The scalable, compact solution gives digital development engineers up to 20 source measure unit channels in a 1U form factor.

While innovation cycles are shortening and digital standards are evolving, designing a semiconductor component or device and delivering it to market remains a time-intensive, technical process. Digital development engineers must connect and test multiple ports on a single device-under-test (DUT) throughout the design cycle to troubleshoot and characterize the performance of the IC. Without high-density, automated characterization solutions, engineers risk slowing their delivery timelines as they validate with complex, multiport designs using complicated and low-density test setups.

Keysight’s PZ2100 Series SMU addresses this risk by giving design engineers a high-density SMU solution that is scalable to 20 SMU channels in a compact 1U rack configuration. The solution also speeds time-to-market with flexible software options, simplified system integration and synchronization, and application-specific measurement capabilities, allowing them to focus more time on characterization and less on synchronization.

The PZ2100 Series SMU delivers the following benefits:

  • Single-box solution – Saves time by simplifying channel stacking and synchronization to remove integration and coding complexity. The user-friendly GUI accelerates test prototyping, debugging, and troubleshooting while the PathWave IV Curve Measurement software enables quick measurements and synchronization without programming.
  • Scalable, compact, and flexible – Saves rack space by offering up to 20 SMU channels in a valuable 1U full-width form factor that does not require cooling spacers when stacked. Available in five SMU module options that are configurable and upgradeable.
  • All-in-one SMU module – Reduces cost by integrating pulser and digitizer functions with conventional SMU functions, such as precise DC voltage and current sourcing and measuring to meet emerging requirements without additional instruments.

www.keysight.com/



Related Articles:

Upcoming Events

EMC Europe 2023
Bruges (Belgium)
02 to 05 September
EUROPEAN MICROWAVE WEEK 2024
Paris (France)
22 to 27 September
ECOC 2024
Frankfurt (Germany)
22 to 26 October

  More events...
  See our Trade Show Calendar
  Click here

 

Advertising
Advertising