|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinks |
SPEA presents new Flying Probe and Bed-of-Nails Testers14 November 2013 - SPEA will present its next generation of automatic board testers – flying probe and bed-of-nails systems – at their booth #255 (Hall A1) in Productronica, that will be held in Munich November 12 th to 15 th, 2013. After years of success worldwide with over 1000 systems installed, SPEA is launching Flying Probe S2, the Multi Core Flying Probe tester series. These systems are based on a revolutionary Multi-Core architecture. Each axis has its own core and its own on-the-axis instrumentation, which guarantees fastest measurement execution along with perfect signal integrity. The new Multi-Jig Platform dramatically enhances parallelism while lowering the cost of test. High speed LED Color test is executed by the 2 Flying LED Color Sensors, while 8-wire measurements guarantee even more speed and flexibility. Highlights include 4x Parallel Power-On, Parallel On Board Programming and Parallel Boundary Scan. 3030 S2 bed-of-nails testers minimizes the cost of test, with an 8-core architecture for Real Parallel Test, comprehensive test capabilities and engineer-less application development. Through Self Programming function, Leonardo OS2 software automatically generates the test program in minutes. |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |