Measurement Software Platform combines Data from multiple Instruments

10 March 2021 - Yokogawa Test & Measurement Corporation launched the IS8000 integrated measurement software platform for the control of and the collection of data and generation of reports from multiple measuring instruments. The IS8000 software combines the functions of software that had previously been provided for individual measuring instruments and is able to provide total support for all measurement tasks, from the connection of instruments to the creation of reports, thus helping to improve product development efficiency.

As well as enabling the operation of and collection of data from Yokogawa measuring instruments, it also supports connection to devices such as high-speed cameras from other companies. This makes it possible to integrate, synchronize, and time stamp the data collected from multiple devices.

This software can aid in the development of motors, inverters, and other types of equipment by synchronizing the measurement data from power analyzers with the multichannel analog measurement signal data from a high-speed data logger. As a total solution that will help customers develop products more efficiently, this software will be offered together with other Yokogawa products such as power analyzers and the new DL950 ScopeCorder.

Development Background

Yokogawa has developed software for use with individual power analyzers, ScopeCorders, and other such instruments. However, in recent years, our customers’ product development evaluation workflows have grown increasingly complex, leading to situations where different measurement instruments must be used together. Under these circumstances, it can be very difficult and time consuming to use separate software tools to collect and compare data from these measuring instruments.

To address this issue, Yokogawa has developed the IS8000 software. This improves efficiency by providing a single interface for the control and synchronization of measurements performed by multiple devices. This also provides a new environment for the integrated handling of fundamentally different types of data (electrical signals, images, etc.), something that previously had been difficult to accomplish.

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