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Latest Test and Measurement NewsMotor Drive Analyzers with guided Test Setups and automated Measurements18 January 2019 – The Fluke MDA 510 and MDA 550 Motor-Drive Analyzers save time and eliminate the hassle of setting up complex measurements, while simplifying the troubleshooting process for variable frequency drives. Simply select a test and the step-by-step guided measurements show where to make voltage and current connections, while the preset measurement profiles ensure you will capture all the data you need for each critical motor-drive section. 200/350MHz Oscilloscopes with deep Channel Memory17 January 2019 - The new SIGLENT SDS2000X-E Series Super Phosphor Oscilloscopes offer a sampling at 2GSa/s with standard record length of 28Mpts/channel and a waveform capture rate of up to 400,000 frames/sec. The oscilloscopes are available in 200MHz and 350MHz bandwidths and support multiple powerful triggering modes that includes built-in serial bus triggering and decoding (I2C, SPI, UART, CAN, LIN). Probe-2-Pad Inspection Station16 January 2019 - aps Solutions developed a tool, that allows the user precisely to check the position of probe tips of a Probe Card versus the probe pads of a Semiconductor wafer. The tool allows to check the behavior of the probe tips under real touch-down conditions as well as investigation of probe tips or needle beams under a microscope. Cable Tester supports 4-Wire Precision Resistance Measurement15 January 2019 - CAMI Research, manufacturer of automation-ready cable and harness test systems, announced the CB53 connector motherboard that will convert a top-mounted standard 64-pin connector board test fixture into a 4-wire test fixture. Conversion is valid when the UUT connects directly into the standard board rather than via a flying lead or adapter cable and eliminates the need to otherwise create custom 4-Wire test fixtures. Testing DDR4 Memory on Prototypes and Production PCBs14 January 2019 – Engineers designing with Double Data Rate 4 (DDR4) memory devices can quickly deploy tests for shorts and opens on control, address and data lines with the boundary scan test (BST) tools of ASSET InterTech’s ScanWorks platform for fast test and programming. Keysight launched new Service Model11 January 2019 - Keysight Technologies announced KeysightCare, a new service model that offers design and test engineers dedicated, proactive support for instruments, software, and solutions. KeysightCare offers access to a range of resources and is available in three service levels. Advantest acquires Semiconductor System Level Test Business from Astronics Corporation10 January 2019 – Advantest Corporation entered into a definitive agreement under which Advantest will acquire the commercial Semiconductor System Level Test business (“Test Systems”), a provider of system level test for semiconductor components and modules, from Astronics Corporation for $185 million, plus an earn-out payment of up to $30 million based on certain performance milestones. More Articles ...
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