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Latest Test and Measurement NewsMemory Burn-In Tester for NAND Flash and DRAM Devices15 October 2018 – Advantest announced its next-generation B6700D memory burn-in tester to meet growing global customer demand for server and mobile data-storage solutions during the memory market’s current super cycle. By measuring the functions of NAND flash and DRAM memory devices during burn-in, this new tester delivers both high throughput and a low cost of test. 5G Base Station Manufacturing Test Solution12 October 2018 - Keysight Technologies announced the Keysight S9100A 5G multi-band vector transceiver (S9100A). The S9100A is a compact and scalable 5G base station manufacturing test solution that enables network equipment manufacturers (NEMs) to streamline volume test of 5G New Radio (NR) infrastructure equipment, accelerating deployment of 5G networks. Transceiver for Testing High Bandwidth Radar Systems11 October 2018 - National Instruments (NI) expands its family of modules using Xilinx UltraScale FPGAs with the first FlexRIO transceiver capable of direct RF sampling. The FPGA-enabled PXIe-5785 FlexRIO transceiver aims to shorten the design cycle for advanced radar applications in aerospace and defense. Protocol Analyzer supporting UFS3.0, UniPro 1.8 and M-PHY 4.110 October 2018 – Teledyne LeCroy introduced the Eclipse T42 UniPro/UFS protocol analyzer and Eclipse M42x UniPro/UFS protocol analyzer/exerciser. The Eclipse T42 and Eclipse M42x platforms offer design and test engineers and system integrators a robust and cost-effective approach to test UFS, the current storage media standard in smartphones, tablets and embedded systems such as heads-up displays (HUD) and advanced driver-assistance systems (ADAS). Family of Coaxial Components for Frequencies from DC to 110 GHz09 October 2018 – Anritsu introduces W1 coaxial components that are metrology-grade designed and manufactured to deliver precision performance and repeatability for high-frequency measurements. Comprised of a W1 connectorized power splitter, power divider, directional coupler and attenuators, the new family removes measurement complexity, reduces measurement setup time, and improves accuracy, making them a superior alternative to millimeter-interfaced solutions. Highly scalable Test Platform for Display Drivers08 October 2018 - Xcerra’s highly flexible Diamondx test platform can scale up to over 5000 display driver digitizers, supporting aggressive multi-site production strategies. With a wide range of general purpose and specialized instruments, the Diamondx platform meets the current and future test requirements of display driver devices, as well as the complete spectrum of multimedia ICs. 4 and 6 Channel LXI Microwave Multiplexers05 October 2018 – Pickering Interfaces launched new four and six channel LXI 50Ω microwave multiplexers in compact 1U and 2U rack-mount form factors. The 60-801 / 60-802 high-performance microwave multiplexers feature excellent RF characteristics and repeatability to within 0.01dB. A choice of up to 16 multiplexer banks with any combination of 6GHz, 18GHz, 26.5GHz and 40GHz bandwidths can be supported. More Articles ...
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