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Latest Test and Measurement News12.8 Gbps SerDes Test Instrument with high Channel Density10 August 2018 - The new Xcerra HSI1x instrument for the Diamondx platform features 32 transmit lanes and 24 receive lanes with up to 12.8 Gbps data rate. The instrument can be used for protocol and physical layer testing of leading edge SerDes ports, such as MIPI, PCIexpress, VbyOne, HDMI and USB, found on the latest applications processors, flat panel display devices, and other high performance ICs. Production Tester for Automotive Radar Sensors09 August 2018 – As essential components for autonomous driving, radar sensors help keep road users safe. With each stage on the way to fully autonomous driving, the number of radar sensors per vehicle rises significantly. Both OEMs and Tier 1 suppliers need reliable test solutions, suitable for mass production, for the large number of safety-related radar-based driver assistance systems. Rohde & Schwarz developed the new R&S AREG100A automotive radar echo generator in close cooperation with the automotive industry. Protocol Analyzer supports PAM4 50G-400G Ethernet08 August 2018 – Teledyne LeCroy announced the industry’s first trace capture and analysis solution for the 802.3cd and 802.3bs 50/100/200/400GE four-level pulse amplitude modulation (PAM4) Ethernet specifications. With the new NET-T200-P4L-A license to the SierraNet T328, the platform enables higher data rates and enhanced reliability for future-generation data centers and cloud-based services. Small Solder-in Probe Head for Oscilloscopes07 August 2018 - Keysight announced the Keysight MX0100A InfiniiMax micro probe head, an extreme small solder-in probe head for oscilloscopes. This micro solder-in head for use with the company's InfiniiMax I/II probe amplifiers is designed to access small geometry target devices. The lead wires can be adjusted for targets from 0 mm to 7 mm apart. Test Solution for Advanced PCIe Gen 4 Solid-State Drives06 August 2018 – Advantest introduced a fully integrated test solution for developing, debugging and mass producing PCIe Gen 4 solid-state drives (SSD) on the proven MPT3000 platform, the same tester used by leading manufacturers of PCIe Gen 3, SATA and SAS SSDs. The new, all-inclusive test solution enables SSD manufacturers to accelerate their newest products’ time to market. USB Spectrum Analyzer for Frequencies up to 18 GHz03 August 2018 - Tektronix expanded its RSA500 family of rugged, battery powered USB-based spectrum analyzers with the addition of the RSA513A and RSA518A offering 13 GHz and 18 GHz frequency range respectively. Along with their higher frequency support, these instruments provide the ability to stream I & Q data for customers to perform analysis consistent with software-defined radio functionality. Cantilever Contacting Solution for High Parallel QFP Testing02 August 2018 - Xcerra’s new HD Kelvin contactor successfully passed a long term evaluation at a major IDM. The application deploys the HD Kelvin for a multisite Kelvin test of a QFP 100 package for the automotive market. Xcerra’s HD Kelvin fully supported the customer’s target to double the test sites and moreover significantly exceeded the customer’s expectation in terms of life span. More Articles ...
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