 |
 |
Main Menu
Newsletter
News Area
Info Area
Weblinks
Product Focus
Readers Top 5 News of last 30 days
- 20 December 2018 - Test Automation Platform certified for Medical Software Engineering
- 19 December 2018 - High Precision Dual-Channel DC Power Supply
- 10 January 2019 - Advantest acquires Semiconductor System Level Test Business from Astronics Corporation
- 09 January 2019 - Signal Generators for testing Automotive eCall-Systems
- 08 January 2019 - Compact JTAG/Boundary Scan Desktop Test System
Latest Test and Measurement News
Parametric Testing for Developing and Manufacturing Next-Generation ICs
13 December 2018 – Advantest introduced its new V93000 SMU8 parametric tester to meet chip makers’ process-characterization and monitoring needs for the exacting measurements required on the 28 nm to 3 nm process nodes and beyond. With per-pin source measurement units (SMU) for next-generation DC parametric testing, the system allows users to quickly measure and verify electrical and timing characteristics at any device pin, thereby enabling more cost-efficient manufacturing and faster time to market for new IC designs.
New Features and Functionality for NI LabVIEW NXG
12 December 2018 – National Instruments (NI) announced a new release of LabVIEW NXG, demonstrating continued investment in the next generation of LabVIEW engineering system design software. The newest version of LabVIEW NXG includes new fast, flexible and web-ready features and simplifies the most time-consuming tasks in automated test and automated measurement applications.
All-in-One 400GbE PAM4 BER Measurements
11 December 2018 - Anritsu released a 64-Gbaud PAM4 Pulse Pattern Generator (PPG) and 32-Gbaud PAM4 Error Detector (ED). This PAM4 BERT supports 400GbE testing when these modules are installed in the Anritsu Signal Quality Analyzer-R MP1900A series to implement a bit-error-rate test solution with best-in-class signal level quality and excellent Rx sensitivity for next-generation broadband communication systems.
Dual-Channel, Multi-Function Arbitrary Waveform Generators
10 December 2018 – Teledyne LeCroy announced a family of High Definition arbitrary waveform generators (AWGs). The dual-channel AWGs are branded T3AWG3252 (250 MHz) and T3AWG3352 (350 MHz) and offer 16 bits of vertical voltage resolution, an output voltage window of up to ±24 V, and waveform memory of up to 1 GS/channel.
E-Mobility Tester offers combination of high and low voltage test
07 December 2018 - WEETECH introduced the new W 484 PLUS test system, which combines an HV relay switching matrix with a cost-effective transistor switching matrix. Complex barriers can be avoided by monitoring the supplied energy. The compact W 484 PLUS high voltage tester tests high voltage cable harnesses and components used in electric or hybrid vehicles with up to 4,300 Vdc or 3,000 Vac.
Digital Oscilloscopes featuring 7 Measurement Functions
06 December 2018 - RIGOL Technologies announces an addition to its UltraVision II family of oscilloscopes with the introduction of the New MSO5000 Series Digital Oscilloscope. The MSO5000 Series offers bandwidth from 70MHz to 350MHz, 8GSa/sec sample rate, 500,000 wfms/sec waveform capture rate, and up to 200M Record Length. System performance, signal resolution and memory depth of the MSO5000 Series is unmatched in its class.
JTAG/Boundary Scan Controller for Industrial Production Use
05 December 2018 - The SCANFLEX II BLADE 4 RMxX of Goepel electronic is a new series of products of the JTAG/Boundary Scan controller platform SCANFLEX II. The controllers provide access to instruments already embedded in the DUT circuit to test and program complex boards with problematic physical access. SCANFLEX II BLADE 4 RMxX constitutes a uniform control platform with up to 12 independent, truly parallel Test Access Ports (TAP). The controllers are directly designed as 19" 1U plug-in units and are therefore particularly suitable for industrial production applications.
More Articles ...
- Test of High-Voltage Semiconductors
- Test Solution for Radiation Measurements on 5G Devices
- Test Handler offers PCB Exchange within less than four Seconds
- Isolated High Voltage 4-Ch 200MHz Oscilloscope
- Protocol Analyzer supports MIPI CSI-2 and MIPI DSI-2 over C-PHY or D-PHY
- Pattern Conversion Software for Cloud-Based Semiconductor Testing
- Arbitrary Function Generator Series with 16 Bit Resolution
- New Data Acquisition System automates and rapidly validates Designs
- Counter Quantum Analyzer for Parallel Readout of 10 Qubits
- Imaging Automotive Radome Tester
- Cellular Vehicle-to-Everything and Advanced Automotive Ethernet Test Solutions
- Digitizers with ultra-long Signal Averaging Capabilities
- 5G NR OTA Measurement Solution
- Switching Current Measurement for Memory Test Systems
- Two 7½-digit Digital Multimeters in just 1U Rack Space
Related Articles:
Upcoming Events
Tag Cloud
RSS Feed
Subscribe to RSS Feed
Social Media
© All about Test 2018