 |
 |
Main Menu
Newsletter
News Area
Info Area
Weblinks
Product Focus
Readers Top 5 News of last 30 days
- 29 May 2019 - Multifunctional OTDR with Touchscreen
- 24 May 2019 - Wide-band Receiver with up to 120 MHz Bandwidth
- 22 May 2019 - Software to Characterize Modulation Distortion in Active Devices
- 28 May 2019 - NI adds new Features and Functionality to LabVIEW
- 27 May 2019 - Integrated Network Analyzers available in Benchtop, USB, and PXI Form Factors
Latest Test and Measurement News
Integrated Network Analyzers available in Benchtop, USB, and PXI Form Factors
27 May 2019 - Keysight Technologies launched the next generation of network analyzers which deliver reliability and repeatability with best-in-class dynamic range, trace noise and temperature stability, as well as a wide range of software applications, enabling engineers to consistently achieve comprehensive device characterization.
Wide-band Receiver with up to 120 MHz Bandwidth
24 May 2019 - The IZT R5010 is a wide-band receiver with a frequency range up to 6 GHz, up to 120 MHz instantaneous bandwidth and powerful internal signal processing. Typical applications are COMINT Systems, satellite monitoring, wide-band RF recorders or quality measurements in mobile communication networks.
Short Link between EDA Environment and Device Tester
23 May 2019 - Advantest Corporation has extended the capabilities of its V93000 SmarTest software with SmartShell, a new software bridge enabling direct communication between any of its V93000 single scalable platform testers and electronic design automation (EDA) environments such as Tessent Silicon Insight software from Mentor, a Siemens business. EDA tools can now connect to a tester remotely through an online network, send test patterns for execution, modify them and retrieve results and failure information directly instead of going through multiple format conversions.
Software to Characterize Modulation Distortion in Active Devices
22 May 2019 - Keysight Technologies announced the optional S93070xB Modulation Distortion application for the company's PNA-X Vector Network Analyzer, which delivers a wide system dynamic range resulting in the lowest possible residual error vector magnitude (EVM) on the market today.
New PCIe-Cards provide up to 80 synchronized AWG-Channels in one PC
21 May 2019 - Spectrum Instrumentation added two new 8-channel-cards to Spectrum's latest "65" series of PCIe Arbitrary waveform generators. As standard, all cards of the "65" series offer a huge on-board memory of 512 MSamples to store and replay lots of waveforms. Using the PCIe-x4 platform, these AWGs provide a data transfer speed which is 5 to 10 times higher than in other solutions, offering 700 MByte/s of FIFO streaming speed.
Data Acquisition Instrument integrates 10 universal analog Channels
20 May 2019 - B&K Precision announced the expansion of the Portable Data Recorder line with the DAS220-BAT. The instrument was developed by B&K Precision's subsidiary Sefram in France, which specializes in the design and manufacture of data acquisition instruments, and other test and measurement solutions. This new recorder is an economical alternative to the DAS240-BAT and features 10 integrated universal analog channels to measure and record voltage, temperature, current, resistance, frequency, and pulse.
Boundary Scan Test Function for SPEA Flying Probe Tester
17 May 2019 - Goepel electronics announced the availability of the SYSTEM CASCON integration for the SPEA Flying Probe system SPEA4080. This allows the current flagship of SPEA's Flying Probe series to be optimally extended with the capabilities of GOEPEL electronic's Embedded JTAG Solutions environment. Thus the user has access to all test functions, which he can execute directly on his SPEA4080 test system.
More Articles ...
- Testing of High-Res Audio ICs
- Dynamic Power Device Analyzer
- Automatic Defect Recognition Function for X-Ray Inspection System
- Multi-Site Testing of 5G-NR mmWave Devices up to 70 GHz
- Digital Integrator for Rogowski Coils
- Fully automated 3-axis Video Measurement System
- Millimeter Wave Noise Sources for Over-the-Air Testing of 5G Devices
- RF Microwave Circuit Design, Simulation and Measurement Teaching Solution
- Current Probe with high Interference Immunity
- Subpixel Metrology for mLED and AR/VR Displays
- Ultra-fast, Inline, 2D Bottom-side Automated Optical Inspection System
- High-speed Spectrum Analysis for Lab and Production
- Current Probe ranging from 30 A to Micro Currents
- PCIe 4.0 U.2/U.3 & M.2 Interposers for SSD Protocol Analysis
- Optical Spectrum Analyzer for Production Test
Related Articles:
Upcoming Events
Tag Cloud
RSS Feed
Subscribe to RSS Feed
Social Media
© All about Test 2018