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Readers Top 5 News of last 30 days
- 28 June 2017 - Power Measurement Software provides multi-unit PC Connectivity
- 05 July 2017 - Test and Measurement Solutions for E-Mobility
- 05 July 2017 - Signaling OTA Testing for IEEE 802.11 ac/n/a/g/b Devices
- 28 June 2017 - RF and Protocol Conformance Tests of 3GPP-Compliant LTE Mobile Terminals
- 28 June 2017 - Lilliput (OWON) launches new Spectrum Analyzer Series
Latest Test and Measurement News
Test and Measurement Solutions for E-Mobility
07 July 2017 – Keysight Technologies announced the launch of a suite of test and measurement solutions for the rapidly growing battery, HEV/EV and HEMS markets. The new solutions enable advancement of cell and battery technologies, electrical powertrain components, and sub-systems used in hybrid and electric vehicles, and in associated energy storage units.
Signaling OTA Testing for IEEE 802.11 ac/n/a/g/b Devices
06 July 2017 - Anritsu Company and ETS-Lindgren announce support of IEEE 802.11 ac/n/a/g/b Over-the-Air (OTA) testing with an enhanced solution that integrates the Anritsu Wireless Connectivity Test Set MT8862A with the CTIA-compliant ETS-Lindgren EMQuest EMQ-100 Antenna Measurement Software. The accurate and flexible turnkey solution now supports 802.11 ac/n/a/g/b WLAN standards, providing device developers and manufacturers with a single solution to characterize and validate designs in accordance with current and emerging versions of the 802.11 standards.
Vector Signal Transceiver for Transceiver Test Applications
05 July 2017 – National Instruments (NI) announced a baseband model of the second-generation Vector Signal Transceiver (VST). The PXIe-5820 module is the industry’s first baseband VST with 1 GHz of complex I/Q bandwidth and is designed to address the most challenging RF front-end module and transceiver test applications, such as envelope tracking, digital pre-distortion and 5G test.
Cost-Efficient Wafer-Level Testing of Mixed Semiconductor Memories
04 July 2017 - Advantest launched the T5822 memory tester, the newest member of its T5800 product series, optimized for wafer-level testing of DRAMs, NAND devices and other non-volatile memories used throughout portable electronic devices. The new tester offers high-voltage resources such a level driver and DC testing capability along with an economical compact test head. It also features a powerful memory repair analysis (MRA) capability to help customers maximize their yields.
Power Measurement Software provides multi-unit PC Connectivity
03 July 2017 - Yokogawa’s new WTViewerE software provides PC connectivity for the company’s industry-leading power analysers - including the WT3000E, WT1800E, WT500 and WT300E models - via Ethernet, USB, GPIB or RS232 interfaces. This connectivity allows users to easily control, monitor, collect and analyse measurement data, and save measurements remotely.
RF and Protocol Conformance Tests of 3GPP-Compliant LTE Mobile Terminals
30 June 2017 – Anritsu released the ME7800L, a Simple Conformance Test System, which enables simple and cost-effective RF and Protocol conformance tests of 3GPP-compliant LTE mobile terminals in one package. The new ME7800L system is a natural evolution from the conformance testing solutions Anritsu ME7873LA (RF) and ME7834LA (Protocol), providing a new concept in 3GPP device certification testing.
Lilliput (OWON) launches new Spectrum Analyzer Series
29 June 2017 - Lilliput (OWON) expands its spectrum analyzer product line with the XSA1000 series. Currently two models are available: NSA1015 and NSA1036. Supporting frequencies of 1.5G and 3.6G frequency the products feature a 10.4-inch large screen and a minimum resolution bandwidth of 10Hz.
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- Wireless Test System supports 802.11ax, Bluetooth 5, ZigBee and Z-Wave
- AXI System optimized for shorter Cycle Times and faster PCB Handling
- IoT Carrier Acceptance Test System facilitates IoT Integration
- Advantest ships 5,000th V93000 Mixed-Signal Test System
- Mid-Range Oscilloscopes with 4, 6, or 8 FlexChannels and Touch Display
- Flying Test Systems increases Test Coverage with XJTAG
- Programmable DC Electronic Load for up to 350W
- NI unveils the next Generation of LabVIEW
- Characterization of Broadband Millimeter-Wave Designs
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