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Latest Test and Measurement NewsPXI Express Chassis with 14 and 21 Slots04 October 2017 - Marvin Test Solutions announced the expansion of its PXI Express (PXIe) product portfolio with the introduction of three new PXIe chassis. The chassis offer a combination of PXIe, hybrid slots, and PXI-1, allowing users to configure the ideal combination of resources for general purpose as well as high-bandwidth test applications. RIGOL launched new 100/200 MHz Oscilloscopes03 October 2017 – RIGOL Technologies introduced its new DS2000E Series Oscilloscope, a 200MHz, 2 channel scope that continues RIGOL‘s tradition of combining unmatched capabilities at unprecedented price points. The DS2000E is available at either 100MHz or 200MHz bandwidths. All models provide 2 analog channels with 50 Ω input impedance standard. Signalling Tester supports LTE-Advanced 1-Gbps IP Throughput Evaluation02 October 2017 – Anritsu Corporation enhanced the functionality of the Signalling Tester MD8475B all-in-one base station simulator with the Enhanced Multi-Signalling Unit MD8475B-071 and LTE 4x4 MIMO Option MX847550B-041. Adding this new option supports the configuration of a simulation environment for 1 Gbps IP data communications combining 4×4 MIMO with high-order modulation (256QAM) and carrier aggregation. E-, B- and H-Field Isotropic Electric Sensor Head29 September 2017 - AR lauched the SHMD400K E-, B– and H-field sensor head consisting of three different sensors combined into one: an electric sensor (E-field), a magnetic induction sensor (B-field) and a magneto-static sensor (H-field). Each sensor within the probe is composed of three mutually orthogonal sensitive elements. Monitoring of Wireless Signals in Real-Time28 September 2017 - Saelig Company announced the availability of the compact RTSA7550 Real-Time Spectrum Analyzer - a powerful, full-featured spectrum analyzer designed to analyze wireless signals in real-time (not progressively scanned). This is essential for seeing intermittent and frequency-varying signals. 64 GBaud BERT Solution for 400G Receiver Testing27 September 2017 – Keysight Technologies announced innovative enhancements for the M8040A high-performance bit error ratio tester (BERT) solution for testing PAM-4 and NRZ devices that operate up to 64 GBaud. Engineers in validation labs and R&D who characterize receivers on the physical layer for emerging 400G data center interconnects will benefit from simplified test setups and repeatable and accurate results. aps Solutions is authorized Distributor of STAr Technologies Probe Cards in Europe26 September 2017 - STAr Technologies, a manufacturer of Semiconductor test systems and probe cards based in Taiwan, named aps Solutions GmbH as authorized distributor for probe cards in Europe and Israel. STAr Technologies delivers cost-effective, high-density vertical probe cards with either buckling beam ("Cobra"), spring- or wire probes. More Articles ...
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