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Readers Top 5 News of last 30 days
Latest Test and Measurement NewsCost-Effective Testing of RF Semiconductors07 July 2016 - Advantest introduced its Wave Scale generation of channel cards for the V93000 platform, which delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal ICs for wireless communications. Designed for highly parallel multi-site and in-site parallel testing, the new V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF semiconductors while creating a path for testing future 5G devices. PCI Express 4.0 Test Solution supports Data Rates up to 16 GT/s06 July 2016 - Tektronix announced a series of enhancements to its suite of PCI Express (PCIe) test solutions including support for the 16 GT/s data rate and the industry’s first automated transmitter and receiver test solutions supporting the PCIe 4.0 architecture. With the faster data rates for PCIe 4.0 technology come new test challenges such as major increases in channel loss, tightening of the total jitter budget and more complex link training and timing requirements. Test Probe for Lead-Free Fine Pitch PCBA Test Applications05 July 2016 - Everett Charles Technologies (ECT) introduces the LFRE-39 spring probe to complete its comprehensive portfolio of products for lead-free test applications. LFRE-39 features ECT’s LFRE plating and is designed to meet fine pitch requirements down to 39 mil (1.0 mm). The LFRE-39 fully meets the demanding requirements of high volume production in-circuit and functional test. BERT Solution for Characterization of PAM-4 and NRZ Devices04 July 2016 – Keysight Technologies introduced a M8040A high-performance BERT for testing PAM-4 and NRZ devices that operate up to 64 GBaud. Engineers in validation labs and R&D who characterize receivers on the physical layer for the next generation of data center interconnects will benefit from simplified test setups and repeatable and accurate results. Eye Diagrams Capabilities for Serial Trigger and Decode Solutions01 July 2016 - Teledyne LeCroy expanded the Serial Data Analysis capabilities for its oscilloscope solutions by introducing as first oscilloscope manufacturer Eye Diagram capabilities in the new TDME Serial Bus options. Eye diagram mask testing and mask failure locator can be used to identify physical layer anomalies. Cost-efficient RF Contactor Solution for FBGA, QFN and Wafer-Level Packages30 June 2016 - Multitest introduced the ACE Contactor, which offers optimal RF performance for fine pitch FBGA, QFN and wafer-level packages. Typical applications for this new contactor are Power Amplifiers, RF switches and mobile communications. The ACE probe has a revolutionary new architecture, which provides exceptional electrical performance, both DC and RF. Impedance Analyzer and LCR Meter measures from DC to 5 MHz29. June 2016 - Zurich Instruments launched a new Mid-Frequency Impedance Analyzer and Precision LCR (MFIA) Meter. The MFIA measures in the frequency range from DC to 5 MHz. Based on the Zurich Instruments' Mid-Frequency (MF) platform, which was successfully introduced in 2015, the MFIA offers 0.05% basic accuracy and a measurement range spanning 1 mΩ to 10 GΩ. It is optimized for testing discrete components, dielectrics, solar cell and semiconductors, as well as bio-impedance monitoring and microfluidic applications. More Articles ...
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