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Latest Test and Measurement NewsTri-Temp MEMS Gravity Handler for MEMS Devices01 March 2016 - Microtec Fertigungs-GmbH (MICROTEC), a manufacturer of customer dedicated test handlers for the Semiconductor packaged device test market, announces successful installation of its customized MH250-EVO SP. The Gravity Handler is now processing engineering and qualification volumes of very small form factor MEMS packaged devices at a local Semiconductor fab in Germany. AXI CT System with unprecedented Detail Visibility01 March 2016 - With the new release of the FF20 CT und FF35 CT systems for computed tomography and thanks to a brand-new 190 kV nanofocus tube, YXLON now achieves in the case of 2D applications an as yet unparalleled detail visibility ≤ 150 nm even at high energies. New CT algorithms provide optimum spacial resolution and care for highest precision and time efficiency at a large range of CT applications. Signal Analyzer featuring 1 GHz Analysis Band29 February 2016 – Keysight Technologies announced new X-Series signal analyzers that provide significantly enhanced capabilities for developers creating next-generation devices. Most notable is a multi-touch user interface (UI) that streamlines measurement setup and creates a solid foundation for new solutions. Performance improvements and feature enhancements address emerging needs in aerospace, defense and wireless communications. Multistandard Test Solution for RF and Audio Tests on Bluetooth Modules29 February 2016 - The modules used in Internet of Things (IoT) applications often combine Bluetooth with other wireless interface technologies. The R&S CMW500 wideband radio communication tester is the only test platform on the market to offer a one-instrument solution for testing all cellular and non-cellular standards and Bluetooth. Rohde & Schwarz has now expanded it leading test platform to include Bluetooth audio tests for manufacturers of Bluetooth headsets and audio car kits. Waveguide Mixer Series for V-Band Millimeter-Wave Measurements26 February 2016 – Anritsu Corporation released its new High Performance Waveguide Mixer MA2806A to expand millimeter-wave measurement solutions. Connecting the new MA2806A to Anritsu’s Signal Analyzer MS2830A supports spectrum measurements in the 50-GHz to 75-GHz band (V-band) currently used by various millimeter-wave sensors, WiGig Gigabit Wireless LAN (802.11ad), and broadcast video camera streaming equipment. Analog Measuring Module with Sensor Supply and up to 100 kHz Sampling Rate25 February 2016 – IPETRONIK extends its measuring module family of the Mx- and Sx-series with the Mx-SENS2 4, a X-LINK module for voltage measurements of up to ±100 V and ICP measurements. The four-channel analog measuring module with sensor supply combines high sampling rates of up to 100 kHz per channel with time-synchronic data acquisition and ICP-mode for piezoelectric sensors, such as acceleration / vibration and acoustic sensors. Optionally, TEDS sensor detection is supported. Vector Network Analyzer Options for Active Multiport Module Test25 February 2016 – Keysight Technologies introduced a series of hardware and software options for the M9485A high-performance PXIe multiport vector network analyzer (VNA). The options further enhance the modular nature of the M9485A VNA by adding a range of new capabilities in support of applications such as base transceiver station (BTS) component test and active multiport module test. More Articles ...
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