Latest Test and Measurement News

AOI and SPI Systems with self-programming Inspection Software

Saki AOI 18 October 2018 - Saki Corporation presented its new 3Di Automated Optical Inspection (AOI) system at SMTA International trade fair. Saki's 3Di Series is the fastest AOI system in the industry. It has scalable resolutions of 7µm, 12µm, and 18µm, closed-loop functionality, and a sturdy frame with a dual-drive system, resulting in accuracy, stability, and reliability.

6,5 Digit Dual Measurement Multimeter

GWInstek GDM 906X 17 October 2018 - GW Instek launched the GDM-906X series 6 ½ digit dual measurement multimeter (2 models: GDM-9061 and GDM-9060), featuring high precision DC voltage accuracy, fast sampling rate, 12 measurement functions, 6 mathematical functions (dB/dBm/Compare/ MX+B/Percent and 1/X) as well as a variety of communications interfaces (USB device/host, RS-232C, LAN, digital I/O and optional GPIB) to provide comprehensive measurement capabilities, higher speed and accuracy.

PC-based Synthesizer for Signals up to 8 GHz

Pico AS108 16 October 2018 - The PicoSource AS108 Agile Synthesizer is the latest addition to Pico's signal generator range. It has professional-grade performance suited to both static and parameter-agile applications, making it a bench or field instrument for developers, scientists, educators, students, and service and installation technicians. It is a compact, low-cost, PC-based, fast-settling signal source. It can deliver sinusoidal CW, swept and hopped parameters and basic AM, FM and ØM modulations in a carrier range of 300 kHz to 8 GHz.

Memory Burn-In Tester for NAND Flash and DRAM Devices

Advantest B6700d 15 October 2018 – Advantest announced its next-generation B6700D memory burn-in tester to meet growing global customer demand for server and mobile data-storage solutions during the memory market’s current super cycle. By measuring the functions of NAND flash and DRAM memory devices during burn-in, this new tester delivers both high throughput and a low cost of test.

5G Base Station Manufacturing Test Solution

12 October 2018 - Keysight Technologies announced the Keysight S9100A 5G multi-band vector transceiver (S9100A). The S9100A is a compact and scalable 5G base station manufacturing test solution that enables network equipment manufacturers (NEMs) to streamline volume test of 5G New Radio (NR) infrastructure equipment, accelerating deployment of 5G networks.

Transceiver for Testing High Bandwidth Radar Systems

NI PXIe 5785 11 October 2018 - National Instruments (NI) expands its family of modules using Xilinx UltraScale FPGAs with the first FlexRIO transceiver capable of direct RF sampling. The FPGA-enabled PXIe-5785 FlexRIO transceiver aims to shorten the design cycle for advanced radar applications in aerospace and defense.

Protocol Analyzer supporting UFS3.0, UniPro 1.8 and M-PHY 4.1

TLC Eclipse M42 10 October 2018 – Teledyne LeCroy introduced the Eclipse T42 UniPro/UFS protocol analyzer and Eclipse M42x UniPro/UFS protocol analyzer/exerciser. The Eclipse T42 and Eclipse M42x platforms offer design and test engineers and system integrators a robust and cost-effective approach to test UFS, the current storage media standard in smartphones, tablets and embedded systems such as heads-up displays (HUD) and advanced driver-assistance systems (ADAS).

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Readers Top 5 News of last 30 days

Latest Test and Measurement News

AOI and SPI Systems with self-programming Inspection Software

6,5 Digit Dual Measurement Multimeter

PC-based Synthesizer for Signals up to 8 GHz

Memory Burn-In Tester for NAND Flash and DRAM Devices

5G Base Station Manufacturing Test Solution

Transceiver for Testing High Bandwidth Radar Systems

Protocol Analyzer supporting UFS3.0, UniPro 1.8 and M-PHY 4.1

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