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Latest Test and Measurement NewsPick and Place Handler for testing High Voltage Applications up to 10 kV21 August 2015 - Multitest has shipped the first MT9510 pick and place handler for testing high voltage applications up to 10 kV (peak). A complete solution can be provided through Multitest’s Plug & Yield program which includes a Multitest high power contactor. The entire set up has been optimized to meet the challenges of cost-efficient and reliable high voltage testing. The Multitest high voltage solution will be deployed for the automotive market (hybrid cars) and for consumer market applications. Fast Production Tests for GNSS Solutions20 August 2015 -- Rohde & Schwarz offers a new, speed-optimized production tester - the R&S SMBV100A vector signal generator equipped with the R&S SMBV-P101 package. The fast GNSS production tester supports the GPS, Glonass, BeiDou and Galileo satellite systems and includes a wealth of additional test functions for characterizing GNSS chipsets and modules. During production testing of modules and receivers for satellite-based communications, the basic GNSS signal reception and the connection between the antenna and GNSS chipset need to be checked. Tektronix introduces 150 MHz Arbitrary/Function Generators19 August 2015 – Tektronix has expanded its AFG3000C Arbitrary/Function Generator Series with two 150 MHz models. Slotting between existing 100 MHz and 240 MHz models in the Tektronix AFG3000C lineup, the new AFG3151C and AFG3152C deliver 25 percent more bandwidth and 59 percent more output zone with +/-5 V DC offset at the same price as competitive offering in this segment. The AFG3000 Series feature an intuitive user interface that shows more information at a single glance, boosting productivity by allowing users to focus on the task at hand. Testing of DRAM Memory ICs with Data Rates up to 16 Gbps18 August 2015 – Advantest introduced a fast fully integrated memory test card, the HSM16G. The new card extends the high-speed testing capabilities of the company’s HSM series of testers to native 16 gigabits per second (Gbps) for at-speed testing of ultra-fast memory ICs. This new product launch makes Advantest the first ATE supplier to provide an integrated test solution that supports device engineering, debugging and volume production of today’s highest speed GDDR5 and future GDDR5X ICs, with parallel data busses up to 16 Gbps. Keysight Technologies acquired Anite17 August 2015 – Keysight Technologies announced that it has completed the acquisition of Anite. Keysight paid approximately $600 million in cash for Anite – a leading supplier of software solutions for wireless research and development – in a deal that supports Keysight’s strategy to grow in wireless and expand its software offerings. PXI-based Wireless Test System optimized for Throughput in Production14 August 2015 - National Instruments (NI) released the Wireless Test System (WTS), a solution that is aimed to lower the cost of high-volume wireless manufacturing test. The WTS combines the latest advances in PXI hardware to offer a single platform for multi-standard, multi-DUT and multi-port testing. When used with flexible test sequencing software, such as the TestStand Wireless Test Module, manufacturers can significantly improve instrument utilization when testing multiple devices in parallel. Flexible and Extendible Solution for SSD Testing13 August 2015 - Advantest offers a new downloadable firmware that enables all MPT3000 systems to test Serial Attached SCSI (SAS) 12G and Serial ATA (SATA) 6G solid-state drives (SSDs), making this tester the first true single-system solution for testing SAS, SATA and PCIe protocol SSDs. The addition of SAS and SATA to the proven support for PCIe 3.0, NVMe and AHCI extends the platform’s test coverage to include SSDs that use any of today’s major protocol standards, enabling SSD manufacturers to leverage one platform to increase their return on investment. More Articles ...
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