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Latest Test and Measurement NewsTest Module for Magnetic Rotation Sensors18 June 2015 - Multitest adds a magnetic rotation stimulus (MRS) module for sensor test on the MT9510 handler to the MEMS/sensor test product line. The module allows for x and y axis testing of magnetic sensors on a flexible and well-established pick and place handler platform. The MRS module, which was originally available for only the MT9928, now also supports test and calibration of sensors in packages which are typically handled on pick and place handlers. Keysight Technologies Extends Duration of Instrument Service, Warranties for New and Out-of-Production Models17 June 2015 – Keysight Technologies announced that it has extended the available service period beyond the industry standard for many of its popular instruments that are no longer in production. The new Extended Service Period (ESP) program addresses a frequent request from customers who need to keep crucial test equipment operating over the life of multi-decade programs. In addition, Keysight is now offering multi-year Warranty Assurance plans that enable end users to lock in peak instrument performance for up to 10 years. FFT Analyzer for low Frequency electromagnetic Fields17 June 2015 – Narda Safety Test Solutions has launched a new FFT analyzer for low frequency electromagnetic fields. The EHP-50F measures and analyzes electric and magnetic field strengths in the frequency range 1 Hz to 400 kHz and evaluates the results in accordance with current human safety standards. Teradyne offers Real-time and Offline Test Data Analysis Software16 June 2015 - Teradyne announced that it entered into an OEM agreement to provide an integrated, advanced analysis capability for Teradyne's entire line of semiconductor test equipment. Under the terms of the agreement, Teradyne will integrate special versions of Galaxy's Examinator and Examinator-Pro software as an option to its Semiconductor Test platforms. Signal Quality Analyzer for High Speed Serial Transmissions15 June 2015 – Anritsu Corporation launched new MP1861A MUX and MP1862A DEMUX modules for the MP1800A Signal Quality Analyzer. This will expand the functions of the MP1800A 32G BERT to support 56G and 64G BER measurements required for evaluating high-speed serial transmission devices, such as SERDES. When used in conjunction with the MP1800A, the two new modules support a generation of NRZ Data and BER measurements up to 64.2 Gbit/s. Boston Semi Equipment ships first Test Handlers from new Facility12 June 2015 - Boston Semi Equipment (BSE) announced that its semiconductor device handler business has shipped the first systems to customers from its new facility. BSE's test handler business will continue the development of the company's line of gravity feed handlers in the new location, while also expanding into other handling technologies and developing custom automation solutions for customers. Current Transducer to measure DC, AC or pulsed current from 60A up to 600A11 June 2015 - LEM extends its range of high-accuracy current transducers, announcing the new series of IT xx5 transducers for non-intrusive and isolated nominal measurements of DC, AC and pulsed currents from 60 A to 600 A. The range includes 4 new models: IT 65-S, IT 205-S, IT 405-S and IT 605-S. More Articles ...
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