|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement News
Intuitive and versatile Tool for optical Power Measurement02 December 2014 — JDSU announced PowerChek, an innovative optical power meter that enables technicians to test and document measurements with unprecedented ease. PowerChek directly measures a bulkhead port’s optical power without the need for a test lead. Instead, interchangeable connectors safely engage the bulkhead port without risking cross contamination or damaging the fiber end face.
CETECOM enlarges EMC Test Capacities01 December 2014 - CETECOM acquired the Mitsubishi Electric International Approval Center (IAC) located in Düsseldorf, Germany. With this acquisition CETECOM enhances its capacities in the EMC sector. Industry segments which have not been the main focus area for CETECOM so far are now added to the CETECOM portfolio.
High Bandwidth, low Noise Oscilloscope Probe for Power Integrity Measurements01 December 2014 – Keysight Technologies introduced the industry’s highest bandwidth and lowest noise oscilloscope probe for making power integrity measurements to characterize DC power rails. The new Keysight N7020A power-rail probe specifications are tailored for a wide variety of DC power-rail measurements. Probe specifications include very low noise, a large ± 24-V offset range and 2-GHz bandwidth.
USB 3.1 Transmitter Testing Solution28 November 2014 – Keysight Technologies introduced transmitter (TX) test support for the USB 3.1 specification with the U7243B USB 3.1 transmitter performance validation and compliance test software. The test software allows authorized test centers to certify SuperSpeed USB and SuperSpeed USB 10-Gbps devices and gives in-house test and performance validation engineers the tools to ensure their devices comply with the USB 3.1 specification. The test software operates on Keysight’s 90000 X-, Q- and Z-Series Infiniium real-time oscilloscopes with bandwidths of 16 GHz and higher. Access to the test signals through a USB test fixture is required. Automotive Radar Tests with Target Simulator and FM CW Signal Analysis28 November 2014 - Rohde & Schwarz is now selling the ARTS turnkey radar target simulator from ITS and miro-sys. When combined with the R&S FSW high-end signal and spectrum analyzer and its analysis option for FM CW chirp signals, the ARTS constitutes an innovative test solution for the development and production of automotive radar sensors. Background: The IP Test EvolutionWe’ll let you decide: “Is it an IP test evolution or revolution?” However, the way to develop test, supply test to others, reuse test, integrate test features, validate test, and target tests to manufacturing is changing. IP Providers, Chip integrators, verification and validation, Test and Product engineering, Failure Analysis, board test, and system testing will be affected by the new IEEE Std. 1149.1-2013 and IEEE Std. P1687. PXIe-Oscilloscope: Reconfigurable, 8 Channels, and 14-bit Resolution27 November 2014 -The NI PXIe-5171R of National Instruments is a reconfigurable oscilloscope with eight calibrated analog input channels, 250 MHz bandwidth, 250 MS/s sample rate, and 14-bit resolution. The PXIe-5171R is a general-purpose module that features a user-programmable FPGA for inline signal processing, protocol decoding, and advanced trigger schemes without dead time. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |