|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement News
New Information Portal focusing on Oscilloscopes25 November 2014 - OScopes.info is a new website providing comprehensive information, helpful background knowledge and latest news about oscilloscopes. The website is intended for all who are using or plan to use an oscilloscope in their job or off work. It supports both experts and unexperienced users in selecting an appropriate oscilloscope for their application as well as in using existing instruments.
World’s fastest IQ PXIe Arbitrary Waveform Generator25 November 2014 – Tabor Electronics released its first high speed IQ AWG for the PXI Express (PXIe) platform, offering advanced arbitrary capabilities and leading industry performance, all in a compact, stand-alone, dual slot PXI product. Equipped with 2.3GS/s, 14 bit clock (typically 2.5GS/s) and 1GHz output stage, the new 52592 is optimized for high bandwidth IQ applications. For applications needing only one IF signal, the new design also can be order in a single channel version, under the model number 52591.
USB 2.0 Connector and Cable Assembly Compliance testing using a Network Analyzer24 November 2014 – Keysight Technologiesannounced the availability of its Method of Implementation (MOI) document for USB 2.0 connector and cable assembly compliance testing using the ENA Series network analyzer’s enhanced time domain analysis option (E5071C-TDR). Passive Oscilloscope Probes operate over wide Temperature Range24 November 2014 - The 10:1 passive oscilloscope probes Model 702902 and 702906 from Yokogawa operate over a wide temperature range from -40°̊C to +85̊C. They are ideally suited to use in accelerated testing and validation methods where temperature cycling is part of the test procedure. The 702902 is designed for use with the isolated BNC input modules of Yokogawa's DL850E ScopeCorder family, whereas the 702906 is intended to be used with the non-isolated BNC inputs of the Yokogawa DLM4000 and DLM2000 Series of oscilloscopes.
Package Characterization at Cold Conditions21 November 2014 - The Multitest MT2168 pick and place handler now offers the ability to characterize devices at cold conditions. This addresses the evolving requirements for temperature performance driven by applications in the end markets. Whereas final test of the respective devices in high volume production will only be done at ambient/hot, they need to get qualified for cold conditions before they ramp.
NI Collaborates with CROWD to define 5G Wireless Communications21 November 2014 – National Instruments (NI) announced its collaboration with CROWD, the European Union Framework Project 7 (EU FP7), to define next-generation wireless 5G communications. CROWD researches the combination of small- and large-density cells in a heterogeneous wireless network for an efficient architecture in which small cells meet traffic hot-spot needs while large cells offer reliable coverage for high-mobility users. Free Android App for Source Measure Unit (SMU) Instruments20 November 2014 – Keithley Instruments has developed a free app for Android-based smartphones and tablets that interacts with a Keithley Series 2600B SourceMeter SMU instrument via its front panel USB interface. IVy, which is the industry's first app developed for SMU instruments, offers benchtop Series 2600B instrument users a fast, easy-to-use touchscreen tool for characterizing 2- and 3-terminal devices. By leveraging the power of smart mobile devices, IVy transforms the Series 2600B into a powerful instrument that enables users to visualize, interact, and share measurement results more efficiently. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |