|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement News
PXI-based Semiconductor Test System22 September 2014 – National Instruments announced the NI Semiconductor Test System (STS) series. These PXI-based automated test systems reduce test cost for RF and mixed-signal devices by opening access to NI- and industry-offered PXI modules in semiconductor production test environments. Compared to conventional semiconductor automated test equipment (ATE), STS lead users are experiencing reduced production costs and increased throughput and can now perform both characterization and production with the same hardware and software tools.
Signal Quality Analyser enables multi-channel BER Measurement of 1 Tbit/s Transmissions19 September 2014 - Anritsu introduced a 32-channel synchronisation function for 32 Gbit/s data signals, an upgrade to its popular MP1800A Signal Quality Analyser. The new function enables the configuration of highly accurate test systems for the measurement of the next generation of ultra-fast communications technologies operating at speeds of 400 Gbit/s and 1 Tbit/s.
Audio Analyzer with extrem low residual THD+N19 September 2014 - Audio Precision introduced the new audio analyzer APx555. The APx555 outperforms the previous flagship instruments of Audio Precision, the SYS-2700 series. Leveraging the modular architecture and powerful software of the APx family, the APx555 delivers improved measurement accuracy, speed, flexibility, automation and ease-of-use for developers of audio components, equipment and systems.
Complete Test of Fluorescent Lamps in less than 30 seconds18 September 2014 - The Fluke 1000FLT Fluorescent Light Tester eliminates the guesswork of maintaining fluorescent lamps by performing all the essential tests on lamps in less than 30 seconds: lamp tester, ballast tester, non-contact voltage detector, pin continuity tester, and ballast discriminator. The 1000FLT eliminates trial, error, and rework, and reduces the time maintenance teams spend fixing lights.
GW Instek launches new economical Safety Testers18 September 2014 - GW Instek launches new economical safety testers, the GPT-9600 Series, which offers an affordable solution for supporting routine tests of major items of the safety standards such as IEC, EN, UL, CSA, GB, JIS and other safety regulations. The GPT-9600 Series is built upon a platform of 100VA AC maximum power output. DDR4 BGA Interposers for Infiniium Series Oscilloscopes17 September 2014 - Keysight Technologiesintroduced DDR4 ball-grid array (BGA) probe interposer solutions for Infiniium Series oscilloscopes. Engineers can use the probes and oscilloscopes for debugging and characterizing DDR4 memory designs and testing device compliance with the JEDEC DDR4 standard. Rohde & Schwarz announces Manufacturing Test License agreement with Broadcom17 September 2014 - Rohde & Schwarz announced it has entered into a Manufacturing Test License (MTL) agreement with Broadcom Corporation. Through the MTL agreement, Rohde & Schwarz can provide certified verification test solutions to Broadcom WLAN and Bluetooth customers. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |