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Latest Test and Measurement News
Keysight Technologies begins Operations04 August 2014 – The electronic measurement business of Agilent Technologies has begun operating under the Keysight name. It will remain a wholly owned subsidiary of Agilent Technologies until early November when the separation is expected to be completed and Keysight begins trading on the NYSE under the symbol KEYS.
Accurate Test Solution for USB 3.1 Receivers01 August 2014 – Agilent announced a highly accurate test solution for characterizing USB 3.1 receivers. Using the Agilent USB 3.1 receiver test set, design and test engineers in the semiconductor and computer industry can now accurately characterize and verify USB 3.1 receiver ports in ASICs and chipsets.
Yokogawa enhanced Mixed Signal Oscilloscopes01 August 2014 - Yokogawa enhanced its DLM2000 mixed-signal oscilloscope with longer memory capabilities and a number of firmware improvements. In the new version, the length of the acquisition memory has been increased up to 62.5 Mpoints in the standard unit and up to 250 Mpoints with the extended memory option. This means that, with the maximum memory installed (/M3 option), in single-shot mode, a 10 kHz signal lasting for more than one hour can be captured.
Dual Channel Function/Arbitrary Waveform Generators31 July 2014 - B&K Precision launched its new 4060 Series line of dual channel function/arbitrary waveform generators. The series includes three models that generate sine waveforms up to 80 MHz (4063), 120 MHz (4064), and 160 MHz (4065). Featuring an advanced pulse generator and high-performance 512k-point arbitrary waveform generator on one channel, these instruments are ideal for use in applications requiring high signal fidelity with extensive modulation and arbitrary waveform capabilities at a value price point.
Probes for high-accuracy on-wafer Measurement from 220 GHz to 1.1 THz31 July 2014 - Cascade Microtech launched the T-Wave series of waveguide probes for on-wafer probing of millimeter wave and sub-millimeter wave circuits. The new T-Wave probe series includes millimeter and sub-millimeter wavelength on-wafer ground-signal-ground probes and associated components for electrical measurement of devices and materials with frequencies up to 1.1 terahertz.
Illuminance Meter for 0.00 to 200,000 lux30 July 2014 - Hioki E.E. Corporation launched the Illuminance Meter FT3424. Illuminance meters are used to measure the brightness of light sources. Illuminance is defined by JIS and other standards, and the FT3424 complies with general classes AA and A as set forth in JIS C 1609-1:2006 and Class B devices under DIN 5032-7.
Inspection and Review Solutions for 16nm Node30 July 2014 - KLA-Tencor announced four new systems — the 2920 Series, Puma 9850, Surfscan SP5 and eDR 7110 — that provide advanced defect inspection and review capability for the development and production of 16nm and below IC devices. The 2920 Series broadband plasma patterned wafer, Puma 9850 laser scanning patterned wafer, and Surfscan SP5 unpatterned wafer defect inspection systems deliver enhanced sensitivity and significant throughput gains. More Articles ...
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