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Impedance Analyzers with Flexible Frequency Options27 May 2014 – Agilent introduced the Agilent E4990A and E4991B impedance analyzers, specifically designed for R&D, quality assurance and inspection engineers characterizing and evaluating passive electronic components, semiconductor devices and materials. The analyzers provide unparalleled accuracy and the best performance in the industry with flexible frequency options, all at an affordable price.
Integrated Test Cell Using for MEMS-Based Sensors26 May 2014 - Advantest has installed a fully integrated test cell for final testing of MEMS-based sensors used in tire-pressure monitoring systems (TPMS) for China’s fast-growing automotive market. The test cell has been qualified and is now being used in volume production at the customer’s site in addition to being available at the customer’s outsourced semiconductor assembly and test (OSAT) partner.
Richard Distl leaves Instrument Systems26 May 2014 - 28 years after establishing Instrument Systems, Richard Distl will be leaving the company at the end of May. Dr. Markus Ehbrecht will succeed him in the position of CEO. The graduate physicist has been working in the executive management of Instrument Systems since January of this year.
Comprehensive Data Management for model-based Development and ECU testing23 May 2014 - Version 1.3 of the dSPACE SYNECT data management software adds powerful model management to its test, signal, parameter and variant management for model-based development. Engineers, software developers and architects using model-based design can now manage system, function and plant simulation models together with the associated interface data, parameters and files.
Differential Probes for High-Speed Bus Testing23 May 2014 – Agilent Technologies introduced the InfiniiMax III+ differential probes, a new generation of 4-GHz, 8-GHz and 13-GHz differential active probes for general-purpose, high-speed differential bus probing. The company also introduced new QuickTip accessories for InfiniiMax probes to help engineers make quick and reliable measurements.
Industry’s First Design-to-Automated Inspection Data Flow22 May 2014 - CyberOptics Corporation announced the close-to-immediate setup of PCB-A inspection using Automated Optical Inspection (AOI) and Solder Paste Inspection (SPI) systems for new products in just one simple step. Programming automated inspection systems has been a long-standing bottleneck for the acceleration of the New Product Introduction (NPI) process; a barrier now removed using the Mentor Valor Process Preparation programing tool in conjunction with CyberOptics inspection systems.
LTE-Advanced Uplink 4x4 MIMO Signal Generation Solution22 May 2014 – Agilent Technologies introduced the industry’s first LTE-A uplink 4x4 MIMO signal generation solution designed to enable R&D engineers to verify FDD and TDD LTE-A Evolved Node B receivers. The solution comprises N7624B/25B Signal Studio for LTE/LTE-Advanced FDD/TDD software with newly added support for UL 4x4 MIMO. More Articles ...
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