|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement News
Agilent Technologies receives Global Growth Leadership Award for Oscilloscopes22 July 2013 – Agilent Technologies received Frost & Sullivan’s Global Growth Leadership Award for Oscilloscopes. Frost & Sullivan’s independent analysis of the oscilloscopes market showed that Agilent demonstrated significant growth over the past two years, outperforming all other market participants and gaining significant share. In the same period, competitors either lost market share or did not grow at nearly the same rate.
Wide-Range Resistance Meter22 July 2013 - Hioki E.E. Corporation launched the Resistance Meter RM3545, a high-precision wide-range resistance tester for both R&D and production lines. The new Resistance Meter features a multiplexer function available through an optional expansion board. When installed, the multiplexer function enables automatic 4-terminal measurement of resistance to be performed sequentially at up to 20 locations, remarkably improving measurement efficiency.
ASSET InterTech acquired Arium19 July 2013 – ASSET InterTech, a supplier of tools for embedded instrumentation, acquired Arium, a provider of software debug tools for systems based on Intel and ARM processors. Arium’s debug tools will be integrated into ASSET’s ScanWorks platform for debug, validation and test, making it a powerful and comprehensive non-intrusive toolset for chip and circuit board designers, manufacturing test engineers and troubleshooting support personnel. 28.4 Gb/s Multiplexer enables accurate Characterization of Receivers10 July 2013 – Agilent Technologies introduced a 28.4-Gb/s multiplexer with optional de-emphasis with up to eight taps for R&D and test engineers who need to characterize receivers for next-generation servers, storage systems and data-center networks. The multiplexer expands the pattern generator bit rate of the J-BERT N4903B high-performance bit error ratio tester.
Test Solution for safety-related Software Development18 July 2013 - TESSY, the tool for automated unit / module / integration testing of embedded software of Hitex Development Tools, was re-qualified for safety-related software development according to IEC 61508:2010 and ISO 26262:2011. The qualification was done by the TÜV SÜD and is valid since version V3.0.18 of TESSY.
Meyer Burger and LayTec cooperate on Metrology Solution for PV Modules18 July 2013 - LayTec announced its cooperation with Meyer Burger, a global technology group specializing in systems, product equipment and services along the photovoltaic value chain including the manufacturing processes for wafers, solar cells, solar modules and solar systems. Combined efforts of both companies resulted in the world’s first fully integrated EVA cross-linking metrology solution for PV module production lines.
Embedded System Access Bundle for Test in Design and Production17 July 2013 - GOEPEL electronic has complemented its range of Boundary Scan complete packages with a new option. SCANFLEX Designer Studio is a complete Boundary Scan test system including hardware, software, and a one-year maintenance contract. It has been developed for test and debug tasks in complex projects and higher system performances in both design and production stages. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |