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Current Probe for measuring Currents in PCB Tracks directly16 July 2013 - The Aim I-prober 520 positional current probe uses a patented technology to observe and measure current without the need to break or surround the conductor. The I-prober 520 is a compact hand-held probe which is used with an oscilloscope. By placing the insulated tip of the probe onto a PCB track, the current flowing in the track can be observed and measured.
Associated Research announces 2-year Standard Warranty on all Instruments16 July 2013 - Associated Research announced a standard 2-year warranty on all new instruments. This guarantees a new AR instrument to be free from defects in workmanship for a period of up to 2 years from the date of shipment. There are no additional costs to the user for this warranty and no requirements for calibration or inspection. Nordson DAGE launches new 4000 Optima Bondtester15 July 2013 – Nordson DAGE launched its new 4000 Optima Bondtester with unique multifunction cartridge (MFC). The 4000 Optima delivers unrivalled performance to meet and exceed test standards combined with ultimate speed and flexibility. The combination of patented technology and superior ergonomics with intelligent and intuitive software provides repeatable and reproducible results. Free Web-Based Seminar examines Curve Tracer for Testing Power Semiconductors15 July 2013 - Keithley Instruments is offering a free, web-based seminar titled “Testing Modern Power Semiconductor Devices Requires a Modern Curve Tracer.” This event, which is available for on-demand viewing, will discuss the curve tracing challenges posed by today’s power semiconductor devices and will teach viewers how to perform both I-V and high voltage C-V measurements with a modern parametric curve tracer.
Test System for NAND Flash and NAND-based MCPs used in Mobile Electronics12 July 2013 - Advantest announced that the T5831 system for testing next-generation ICs used in mobile applications, including NAND Flash with high-speed ONFi or Toggle Mode interfaces as well as managed NAND devices such as embedded multi-media cards (eMMC), is now being delivered to customers. The versatile tester also supports concurrent testing of both NAND Flash and mobile DRAM in a multi-chip package (MCP).
Evaluation Platform for the Development of safety-critical Systems12 July 2013 - The SafeTI-HSK kit – developed in close collaboration between Hitex and Texas Instruments – makes functional safety come alive and allows customers to develop designs targeting compliance to IEC 61508 or ISO 26262. The kit provides capabilities for hardware fault injection, application and run-time profiling of fault diagnostics, and system response monitoring in real-time and enables developers to easily test performance of the SafeTI components.
Development Platform for Li-Ion Battery Management Systems11 July 2013 - dSPACE’s new offerings for developing in-vehicle battery management systems (BMS) simplify the development of critical battery management algorithms by enabling precise, fast measurement and control of cell voltages for modern Li-ion batteries. Complex systems like a BMS interact with several vehicle systems such as the powertrain, energy management, vehicle safety, infotainment, etc. More Articles ...
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