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Latest Test and Measurement NewsEnhanced Solution for PCI Express 3.0 Receiver Characterization11 February 2013 – Agilent Technologies announced an enhanced solution for PCI Express 3.0 receiver characterization. The solution provides complete and accurate receiver tolerance test results while minimizing R&D effort. The new J-BERT software (revision 7.40) enables testing of PCIe 3.0 receiver designs that adjust the length of the 128b/130b encoded filler symbols—also known as SKP ordered sets—as needed for clock compensation. Fluke Corporation recalls Digital Clamp Meters11 February 2013 – Fluke Corporation is voluntarily recalling Digital Clamp Meters 373, 374, 375, and 376 that were manufactured between Sept. 1, 2010 and Oct. 31, 2012. Hazard: The printed circuit assembly in these units may not be properly fastened to the test lead input jack. This may result in inaccurate voltage readings, including a low or no voltage reading on a circuit energized with a hazardous voltage, presenting a shock, electrocution, or thermal burn hazard. Datacentre Activities boost global Ethernet Test Equipment Market08 February 2013 – An increase in datacentre activities, rapid growth of the 40/100 GbE market, mobile backhaul applications, and infrastructure development by end users to accommodate gigabit Ethernet are driving the global Ethernet test equipment market. A new analysis from Frost & Sullivan finds that the market earned revenues of $822.5 million in 2011 and estimates this to reach $1225.7 million in 2016. The 1 GbE, 10 GbE and 40/100 GbE test equipment segments are expected to grow at single, double and triple digit rates, respectively. GW Instek introduces new Series of Digital Storage Oscilloscopes08 February 2013 - The new GDS-2000A series Digital Oscilloscope of GW Instek features 2Ga/s sampling rate, 2M record length, 2 or 4 input channels and a large 8” screen color LCD display, to perform fast waveform acquisition and procession at 80,000 wfms/s update rate utilizing VPO (Visual Persistence Oscilloscope) technology. The GDS-2000A series, carrying bandwidths of 300MHz, 200MHz, 100MHz and 70MHz and inputs of 2 and 4 channels, makes up a family of 8 in the whole series. Electron-Beam Inspection System for Wafer Inspection07 February 2013 - KLA-Tencor Corporation announced the eS805, a new electron-beam inspection system for leading-edge chip manufacturers. The eS805 offers strong capability in detection of very small defects and defects that cause electrical problems in the integrated circuit, such as opens, shorts or reliability issues. The eS805 is also designed to provide supplementary information to the fab's optical inspection systems, with the goal of boosting the ability of the optical inspectors to preferentially capture defects that matter. Toolset for Serial Data Link Analysis06 February 2013 – Tektronix announced a new Serial Data Link Analysis Visualizer software package (SDLA Visualizer) for Tektronix performance oscilloscopes including the DPO/DSA/MSO70000 Series. Designers working on next generation high-speed serial standards can use SDLA Visualizer to specify their link, de-embed any components from the measurement path, simulate virtual link components, apply equalization and take measurements at multiple points on the transmission line in a serial data system, module or chipset. 7 and 12 MHz DDS Sweep Function Generators for Basic Applications06 February 2013 - B&K Precision announced two new DDS (direct digital synthesis) sweep function generators, models 4007B and 4013B, which improve upon the former models 4007DDS and 4013DDS with an enhanced user interface as well as lower prices. Models 4007B and 4013B can generate sine and square waveforms from 0.1 Hz to 7 MHz and 0.1 Hz to 12 MHz respectively. Both models also output triangle/ramp waveforms from 0.1 Hz to 1 MHz and provide variable output voltages from 0 to 10 Vpp into 50 ohms or 20 Vpp into open circuit. More Articles ...
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