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Latest Test and Measurement NewsDatacentre Activities boost global Ethernet Test Equipment Market08 February 2013 – An increase in datacentre activities, rapid growth of the 40/100 GbE market, mobile backhaul applications, and infrastructure development by end users to accommodate gigabit Ethernet are driving the global Ethernet test equipment market. A new analysis from Frost & Sullivan finds that the market earned revenues of $822.5 million in 2011 and estimates this to reach $1225.7 million in 2016. The 1 GbE, 10 GbE and 40/100 GbE test equipment segments are expected to grow at single, double and triple digit rates, respectively. GW Instek introduces new Series of Digital Storage Oscilloscopes08 February 2013 - The new GDS-2000A series Digital Oscilloscope of GW Instek features 2Ga/s sampling rate, 2M record length, 2 or 4 input channels and a large 8” screen color LCD display, to perform fast waveform acquisition and procession at 80,000 wfms/s update rate utilizing VPO (Visual Persistence Oscilloscope) technology. The GDS-2000A series, carrying bandwidths of 300MHz, 200MHz, 100MHz and 70MHz and inputs of 2 and 4 channels, makes up a family of 8 in the whole series. Electron-Beam Inspection System for Wafer Inspection07 February 2013 - KLA-Tencor Corporation announced the eS805, a new electron-beam inspection system for leading-edge chip manufacturers. The eS805 offers strong capability in detection of very small defects and defects that cause electrical problems in the integrated circuit, such as opens, shorts or reliability issues. The eS805 is also designed to provide supplementary information to the fab's optical inspection systems, with the goal of boosting the ability of the optical inspectors to preferentially capture defects that matter. Toolset for Serial Data Link Analysis06 February 2013 – Tektronix announced a new Serial Data Link Analysis Visualizer software package (SDLA Visualizer) for Tektronix performance oscilloscopes including the DPO/DSA/MSO70000 Series. Designers working on next generation high-speed serial standards can use SDLA Visualizer to specify their link, de-embed any components from the measurement path, simulate virtual link components, apply equalization and take measurements at multiple points on the transmission line in a serial data system, module or chipset. 7 and 12 MHz DDS Sweep Function Generators for Basic Applications06 February 2013 - B&K Precision announced two new DDS (direct digital synthesis) sweep function generators, models 4007B and 4013B, which improve upon the former models 4007DDS and 4013DDS with an enhanced user interface as well as lower prices. Models 4007B and 4013B can generate sine and square waveforms from 0.1 Hz to 7 MHz and 0.1 Hz to 12 MHz respectively. Both models also output triangle/ramp waveforms from 0.1 Hz to 1 MHz and provide variable output voltages from 0 to 10 Vpp into 50 ohms or 20 Vpp into open circuit. USB 2.0 Signal-Quality Test Option05 February 2013 – Agilent Technologies introduced the industry’s lowest-priced USB 2.0 signal-quality test option. This option for the InfiniiVision 4000 X-Series oscilloscopes supports low-speed, full-speed and hi-speed USB applications. The USB interface is used extensively for computer applications and for a broad range of embedded connectivity applications. AT4 wireless invests in 3G and LTE Test Equipment05 February 2013 - AT4 wireless and Anritsu have recently closed an agreement to bring Anritsu test equipment for 3G and LTE conformance and carrier testing to the AT4 network of testing laboratories. The agreement includes RF, RRM and Protocol testing equipment which will be located in Spain, USA, Taiwan and Japan. More Articles ...
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