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Latest Test and Measurement NewsMVTS Technologies acquires Electroglas Wafer Prober Assets14 January 2013 - Global service and technology solutions provider MVTS Technologies has acquired the Electroglas wafer prober assets from Zenovus Pte. Ltd. and will now provide global sales and service for the Electroglas 4080, 4090, 4090u, 4090u+ and 6000 product lines. Under the terms of the asset purchase agreement, MVTS has acquired all global inventory and goodwill, in addition to retaining key directors and employees. PXI Solid State Multiplexer14 January 2013 – Pickering Interfaces is expanding its range of solid state PXI versatile multiplexers with the introduction of the 40-683. The 40-683 is a single slot 3U PXI module providing a versatile multiplexer solution capable of supporting multiple MUX configurations that include single pole, two pole and multiple bank capabilities from a single module. Typical selectable configurations vary from a single bank 128:1 MUX to 8 banks of 8:1-2 pole MUXs with all the MUX possibilities from a single module. Yokogawa launches 5th Generation of it’s Power Meter11 January 2013 - The new WT300 series of digital power meters are the fifth generation of Yokogawa's best-selling compact digital power meters: instruments that play a key part in ensuring optimum standards of energy efficiency and conservation by measuring the power consumption of electrical equipment. Key features of the new instruments include a basic accuracy of 0.1% of reading and a wide measurement range from standby power levels of a few milliamperes up to the 40 A. NI Instrument Driver Network Reaches 10,000 Drivers10 January 2012 – National Instruments announced that the NI Instrument Driver Network (IDNet) has reached a new milestone of 10,000 instrument drivers for automating stand-alone instrumentation. From IDNet, you can access free, NI-certified instrument driver downloads for NI LabVIEW system design software, NI LabWindows/CVI and Microsoft Visual Studio .NET. IDNet instrument drivers simplify instrument control across a variety of buses including GPIB, USB, PXI, PCI, Ethernet, LXI and RS232. Low-Cost Testing of Integrated Microcontroller and Smart Card ICs09 January 2013 - Semiconductor test equipment supplier Advantest Corporation has introduced its new T2000 Integrated Massive Parallel test solution (IMS), a test system capable of achieving the lowest cost of test for microcontroller units with integrated analog and embedded flash memory circuits. Designed to enable large-scale testing of up to 256 devices simultaneously, Advantest's new test solution achieves high throughput and fast test times with a parallel efficiency target of more than 99 percent. “Green” Regenerative Battery Test System09 January 2013 - NH Research introduced recently its 9200 Battery Test System that is capable of recuperating energy in Sink (Battery Discharge) mode and deliver back to the Utility Grid. In addition the 9200 system eliminates the need for additional cooling like power consuming air conditioners or water cooling to remove waste heat associated with traditional high power battery test systems. The saving is double. Handheld Spectrum Analyzers with Frequency Coverage up to 43 GHz08 January 2013 – Anritsu introduces the Spectrum Master MS2720T series, the highest performance handheld spectrum analyzers available in the world. Providing field technicians and engineers with performance that rivals a benchtop spectrum analyzer, the MS2720T features a touchscreen, full-band tracking generators to 20 GHz, and best-in-class performance for dynamic range, DANL, phase noise, and sweep speed, providing unprecedented levels of spectrum monitoring, hidden signal detection, RF/microwave measurements, and testing of microwave backhauls and cellular signals. More Articles ...
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