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Latest Test and Measurement NewsRack-Mount Controller and PXI Express Remote Controller27 November 2012 – National Instruments extends the PXI platform with the NI RMC-8355 rack-mount controller and the NI PXIe-PCIe8381 PXI Express remote controller. The RMC-8355 1U rugged rack-mount controller for PXI and PXI Express systems features up to two high-performance quad-core Intel Xeon E5620 processors, making it ideal for high-performance test and measurement applications, and mission critical test and control. Wafer MVM-SEM Tool supports Next-Generation Devices26 November 2012 - Advantest has introduced its new Multi-Vision Metrology Scanning Electron Microscope, the Wafer MVM-SEM E3310, which measures fine-pitch patterns on a wide range of wafer types with unparalleled accuracy, utilizing Advantest’s proprietary electron beam scanning technology. Built on advances in the technology used in Advantest’s E3630 MVM-SEM for photomasks, the E3310 achieves superior capabilities for scanning and measurement of wafers for next-generation devices. UL and VDE Strengthen Cooperation in Health Sciences26 November 2012 - UL and the VDE Testing and Certification Institute signed a Memorandum of Understanding which will increase the cooperation between the medical / laboratory equipment divisions at VDE and the Health Sciences sector at UL LLC. Both companies are active in the field of verification and certification in health care and have signed the MOU to combine their efforts to best support medical device and laboratory equipment manufacturers with achieving global regulatory approval. Ultra-low Jitter, high Bandwidth Solutions for 100G Transceiver Testing23 November 2012 – Tektronix announced a new Phase Reference Module, the 82A04B, for the DSA8300 oscilloscope that when combined with new electrical sampling modules provide instrument jitter of <100 femtoseconds, typical. This represents the lowest instrument jitter of any multi-channel oscilloscope on the market, sampling or real-time, making the DSA8300 the instrument of choice for design, debug and characterization of critical 100G transmitters and links on up to 6 channels as defined in the IEEE802.3ba & 32G Fibre Channel test specifications. Video Testers support Tests on analog Audio/Video Interfaces23 November 2012 — Rohde & Schwarz has introduced an analog analyzer module for the R&S VTC video test center, the R&S VTE video tester and the R&S VTS compact video tester. This module enables manufacturers of consumer electronics equipment to comprehensively test the latest digital interfaces such as HDMI and MHL as well as classic analog audio/video interfaces using only one measuring instrument. Anritsu announces Approval of new LTE Conformance Test Cases22 November 2012 - Anritsu announced that in the area of RF and RRM testing 21 new test cases and for Protocol 221 new test case were approved. These key industry tests are becoming highly relevant to support the global deployment of LTE networks and devices, particularly as many leading Smartphones are now LTE capable and are being promoted in leading networks. NI LabVIEW supports USB3 Vision Standard22 November 2012 – National Instruments announced NI LabVIEW support for the new USB3 Vision camera standard through the NI Vision Acquisition Software driver package. The standard offers significant performance and usability improvements compared to USB 2.0 cameras and popular interfaces, such as GigE Vision, with faster bandwidth up to 400 MB/s and 4.5 W to directly power cameras. USB3 Vision cameras also offer plug-and-play functionality and ease of use through a standardized catalog of functions. More Articles ...
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