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Latest Test and Measurement NewsHandheld Spectrum Analyzers to track elusive Signals in the Field06 December 2012 – Tektronix announced the H500 and SA2500 Handheld Spectrum Analyzers that include DPX waveform image processor technology to provide a live RF view of the spectrum. With unique DPX technology along with built-in mapping and signal classification features in a compact, ruggedized package, the instruments are designed to allow spectrum regulators to efficiently manage and monitor spectrum in the field and hunt down elusive signals and interferers. 7Layers now offering ECC testing for MIMO LTE05 December 2012 - 7Layers, an international group of certified, accredited test laboratories and developer of test systems and products, announced that it is the first certified test lab to measure Envelope Correlation Coefficient (ECC). ECC and its measurement is an important parameter to be considered while developing an LTE device supporting MIMO (Multiple Input and Multiple Output) antenna system. Konica Minolta acquires Instrument Systems05 December 2012 - Konica Minolta Optics, Inc. announced that it has acquired Instrument Systems GmbH (IS), a major German lighting measurement equipment manufacturer. As a business company of the Konica Minolta Group, KMOP manufactures and sells optical products and measuring instruments for industrial and healthcare applications. Six New I/O Modules for NI CompactRIO and NI CompactDAQ Platforms04 December 2012 – National Instruments announced six new C Series modules designed for NI CompactRIO embedded control systems and NI CompactDAQ modular data acquisition systems. By expanding the C Series platform, NI provides engineers and scientists with new and improved options for a wide variety of embedded control, monitoring and data acquisition applications. High-Speed Test for CMOS Image Sensing Devices03 December 2012 - Advantest Corporation has introduced the IC industry’s fastest image-capture module to cost-efficiently test the high-frequency, low-power D-PHY and M-PHY interface chips. The new T2000 3Gbps CMOS Image Capture Module operates on Advantest’s T2000 ISS system, an industry-leading test platform for a broad range of system-on-chip (SoC) devices. High-Performance Noise-Figure Measurement Technique up to 50 GHz30 November 2012 – Agilent Technologies announced the extension of its source-corrected noise-figure measurement capability in PNA-X network analyzers to 43.5 and 50 GHz, while continuing to maintain the highest noise-figure measurement accuracy in the industry. Built directly into the Agilent PNA-X, the technique provides a complete single-connection, multiple-measurement capability for R&D and manufacturing engineers developing and testing low-noise transistors, amplifiers, frequency converters and transmit/receive modules. Desktop Automatic Optical Inspection (AOI) System30 November 2012 - Prueftechnik Schneider & Koch presents a new AOI tabletop system. In spite of its compact size, the LaserVision Compact 4 offers technical characteristics that could be found only in large inline systems until now. The innovative chassis that comes in a completely new look houses inside a wealth of technical innovations. Heart of the new Laser Vision Compact 4 is the rotating camera head to inspect boards and components of any mounting angle. More Articles ...
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