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Readers Top 5 News of last 30 days
Latest Test and Measurement NewsMask Defect Review SEM for Next-Generation Photomasks20 November 2012 - Advantest Corporation developed a new mask defect review tool, the Mask DR-SEM E5610, for reviewing and classifying ultra-small defects in photomask blanks. The E5610 inherits the highly stable, fully automatic image capture technology developed by Advantest for its acclaimed multi vision metrology SEM for photomasks, and features a newly developed beam tilt mechanism that enables scanning at oblique angles. Corelis enhances I2C Exerciser19 November 2012 – Corelis, a supplier of boundary-scan test and measurement tools, has released a new version of its I2C Exerciser software, Version 1.23. The software improves the capabilities of Corelis’ powerful BusPro-I and CAS-1000-I2C/E bus analyzer products. Simplified Creation of Wireless Signaling Tests19 November 2012 — Rohde & Schwarz has developed a new and innovative graphical test script development tool for its R&S CMW500 wideband radio communication tester. The new R&S CMWcards user interface significantly simplifies test case creation. Using the interface's specification-compliant signaling sequences, users can effortlessly create test cases on the R&S CMW500 test platform – without any programming. Tektronix revolutionizes ASIC Prototyping16 November 2012 - Tektronix introduced version 2.0 of its Certus ASIC prototyping debug solution. A suite of software and RTL-based embedded instruments, Certus 2.0 fundamentally changes the ASIC prototyping flow by enabling full RTL-level visibility and making FPGA internal visibility a feature of the prototyping platform. This simulation-level visibility allows engineers to diagnose multiple defects in a day versus a week or more with existing tools. Vector Network Analyzer for Semiconductor and Mobile Device Test16 November 2012 – National Instruments announced the NI PXIe-5632 VNA, optimized to help engineers meet increasingly complex RF test requirements at a fraction of the cost, size and time compared to traditional rack-and-stack solutions. The new PXIe VNA is built on an innovative dual-source architecture with frequency range covering 300 kHz to 8.5 GHz, independently tuned sources and source access loops to cover a diverse set of measurement applications. Execute BER Tests using on-board FPGA15 November 2012 - GOEPEL electronic introduces the first ChipVORX model prototype to execute Bit Error Rate Tests (BERT) using on-board Field Programmable Gate Arrays (FPGA). The new solution enables the utilisation of FPGA Embedded Instruments in the form of special softcores for the test and design validation of high-speed I/O. This will allow users to evaluate the quality of interconnections by way of bit error rates and also by analysing eye diagrams and is compatible with the newest FPGA families. New Harmonic Filters for Microwave Signal Generator15 November 2012 — Rohde & Schwarz offers harmonic filter options for its R&S SMB100A microwave signal generator. These filters make it possible to achieve a harmonic suppression of more than –50 dBc over a wide frequency range from 150 MHz to max. 40 GHz. At low frequencies below 3 GHz, it is even possible to achieve an excellent –58 dBc. More Articles ...
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