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Latest Test and Measurement NewsNI unveils Industry’s fastest PXI Embedded Controller14 September 2012 – National Instruments introduced the NI PXIe-8135, which features the quad-core 3rd generation Intel Core i7 processor and USB 3.0 connectivity, making it the industry’s fastest PXI embedded controller. The NI PXIe-8135 helps engineers achieve shorter test times and increase automated test throughput, further advancing PXI instrumentation for high-performance test, measurement and control applications. Accelerate Large-Scale Active Antenna Calibration and Testing13 September 2012 – Agilent Technologies introduced the industry’s widest-bandwidth real-time digital downconverter option on the M9703A AXIe eight-channel high-speed digitizer. The new DDC functionality enables faster, more flexible measurements in high-channel-count applications. Ultra Low-Cost USB 2.0 Protocol Analyzer13 September 2012 - Teledyne LeCroy announced a low cost USB 2.0 analyzer that provides many of the same powerful features as their top selling Voyager system in a new, pocket-sized form-factor. Priced at only $875, the base model Mercury T2 includes hardware triggering and full device class decoding allowing it to address a wide range of USB 2.0 debug applications. KLA-Tencor announces new Reticle Inspection Systems12 September 2012 - KLA-Tencor Corporation announced two new additions to the company's IC fab-based reticle inspection portfolio: the X5.2 and Teron 611 systems. As the latest offering in the successful 5XX product line, the new X5.2 applies its high performance to capture defects and pattern degradation on masks currently in production, with extended capability for the upcoming 20nm node. The Teron 611 is designed for the 20nm node and beyond, offering technology-enabling sensitivity to inspect masks at the leading edge of IC production. NI TestStand 2012 increases Automated Test Throughput and Flexibility12 September 2012 – National Instruments introduced NI TestStand 2012, the latest version of its automated test management software. With its new modular process architecture, NI TestStand 2012 helps engineers increase the flexibility and throughput of their automated test systems. The new modular framework makes test setup easier, expands test and reporting flexibility, and makes it possible for engineers to simultaneously test and report during parallel testing. Agilent Technologies announces Hardware Upgrade for ENA Network Analyzers11 September 2012 – Agilent Technologies announced the latest upgrade of the company’s E5071C ENA series network analyzer’s digital hardware. The measurement cycle time of the new hardware is two times faster than that of any other competitive RF network analyzer. High-speed differential Probe for high-voltage Oscilloscope Measurements10 September 2012 - The Yokogawa Model 701927 is a new high-speed differential probe for high-voltage floating signal measurements using the company’s DLM2000 Series of mixed-signal oscilloscopes and other instruments equipped with the Yokogawa probe interface. The 701927 has a 3 dB bandwidth of DC to 150 MHz, and can measure differential or common-mode voltages up to ±1400 V (DC plus AC peak) or 1000 V RMS. More Articles ...
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