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Latest Test and Measurement NewsSolutions for Complex Modulation Tests up to 63 GHz20 September 2012 – Agilent Technologies announced the industry’s first real-time optical modulation analyzer with a bandwidth of 63 GHz. The new instrument allows researchers to characterize the latest coherent receivers and ultrafast transmitters with a sample rate of 160 GSa/s at 63 GHz electrical bandwidth. OTDR Tool for Field Network Installation and Maintenance19 September 2012 – Anritsu introduces the next generation ACCESS Master field portable OTDR. Based on its leading MT9083 series ACCESS Master OTDRs, the next generation MT9083 provides even more of the features required by field technicians, engineers and contractors. A larger, higher resolution 7 inch TFT display with excellent indoor/outdoor performance is now standard providing users with greater readability – even in direct sunlight. GOEPEL electronic automates Utilisation of Chip Embedded Instruments19 September 2012 - GOEPEL electronic announces the development of an Automatic Application Program Generator (AAPG) for the utilisation of Chip embedded Instruments based on the ChipVORX technology. The new generator is another option within the integrated JTAG/Boundary Scan software platform SYSTEM CASCON. The AAPG is a versatile tool providing for the utilisation of any chip embedded instrument. Economical, programmable 5½-Digit Digital Multimeter18 September 2012 - Keithley Instruments expands its digital multimeter (DMM) product line with an economical new offering. The Model 2110 5½-digit Dual-Display Digital Multimeter is optimized for a variety of general-purpose system and bench design applications. When compared with leading 5½-digit DMMs, the Model 2110 offers superior throughput (up to 10x faster), accuracy (up to 2x better DC voltage accuracy), a lower purchase price, and greater integration flexibility. ASSET integrates ScanWorks with Teradyne’s PXI Express Instruments18 September 2012 – ASSET InterTech and Teradyne have extended the integration of the JTAG and boundary-scan test capabilities of ASSET’s ScanWorks platform for embedded instruments into Teradyne’s PXI Express-based High Speed Subsystem (HSSub). Last year, ASSET and Teradyne collaborated to integrate ScanWorks into Teradyne’s VXI-based Di-Series instruments, which are widely deployed in large-scale test systems in defense/aerospace, such as the Teradyne Spectrum 9100 and Lockheed Martin’s LM-STAR. 6 GHz Solid state Switching Matrix17 September 2012 – Pickering Interfaces is expanding its range of 6 Ghz solid state switching modules with the introduction of the first RF solid state matrix in PXI, the 40-884. The module provides a 4x4 matrix which occupies 3 slots of a 3U PXI chassis. The design provides excellent input VSWR to greater than 6 GHz and features high port to port isolation to ensure that input and output signals do not interfere with each other. NI unveils Industry’s fastest PXI Embedded Controller14 September 2012 – National Instruments introduced the NI PXIe-8135, which features the quad-core 3rd generation Intel Core i7 processor and USB 3.0 connectivity, making it the industry’s fastest PXI embedded controller. The NI PXIe-8135 helps engineers achieve shorter test times and increase automated test throughput, further advancing PXI instrumentation for high-performance test, measurement and control applications. More Articles ...
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