|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement NewsMagnetic Field Coil generates Fields up to 1200 A/m23 July 2012 - Teseq, a developer and provider of instrumentation and systems for EMC emission and immunity testing, offers a new magnetic field coil that generates fields up to 1200 A/m during magnetic field testing. The INA 703 is designed for testing to IEC 61000-4-8 (supply frequency magnetic fields), IEC 61000-4-9 (pulsed magnetic fields) and IEC 61000-4-10 (oscillatory magnetic fields) standards. It is ideal for medical equipment, military, avionics, aerospace and industry applications. Agilent acquires AT4 wireless’ Test Systems Business20 July 2012 – Agilent Technologies and AT4 wireless announced that they have signed a definitive agreement for Agilent to acquire the assets of AT4 wireless’ Test Systems business. Privately held AT4 wireless, based in Malaga, Spain, is a global provider of testing services and solutions for wireless communications. The acquisition is expected to be completed by early August, subject to customary closing conditions. Financial details were not disclosed. USB PC based 100 MHz Oscilloscope19 July 2012 – GAO Tek Inc. is offering a 100 MHz high performance 8-bit, two-channel computer-based USB digital storage oscilloscope. The portable oscilloscope, model A0120009, operates at a maximum real-time sampling rate of up to 250 MS /s and 100 MHz bandwidth. It combines the functions of an oscilloscope, a spectrum analyzer, a waveform recorder, a signal generator, a voltmeter and a cymometer into one unit. Wafer Inspection System for Sub-20nm Era18 July 2012 - Applied Materials unveiled its Applied UVision 5 wafer inspection system for detecting defects in the critical patterning layers of logic devices at the sub-20nm node. The system's deep ultra-violet (DUV) laser and simultaneous brightfield and greyfield light collection capabilities deliver up to double the light intensity to the wafer over previous tools, enabling the UVision 5 system to capture up to twice the number of killer defects. This unmatched sensitivity allows semiconductor manufacturers to achieve more stable and robust control over the fabrication of their smallest circuit features. Fluke 190 ScopeMeter Recall18 July 2012 - Fluke is voluntarily recalling its 190 Series ScopeMeter 100MHz and 200MHz 4 Channel Hand Held Oscilloscopes that contain firmware version V10.40. This includes all units manufactured after February 5, 2012 and all units upgraded to firmware version V10.40 after February 5, 2012. Teradyne increases J750 Platform Throughput and Test Coverage17 July 2012 - Teradyne announces the availability of the High Density Device Power Supply (HD DPS) instrument for the J750 and IP750 test platforms. The HD DPS instrument enables semiconductor companies to increase site count and DC measurement throughput resulting in lower cost of test for thousands of consumer digital devices including microcontroller, image sensor and standard logic devices. Teradyne has received multiple orders from multiple customers for the new HD DPS instrument and begun product shipments. LeCroy introduces new Oscilloscopes with Long Memory, High Sample Rate and Large Display16 July 2012 - LeCroy announced two new lines of the popular WaveAce oscilloscope series ─ the WaveAce 1000 and WaveAce 2000. WaveAce 1000 oscilloscopes feature a sample rate of up to 1 GS/s with 2 Mpts of memory in two-channel models from 40 MHz to 100 MHz. WaveAce 2000 oscilloscopes deliver sample rates of up to 2 GS/s and 24 kpts of memory and are available in two- and four-channel models from 70 MHz up to 300 MHz. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |