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Latest Test and Measurement NewsGeotest introduces new Manipulator Option and Receiver for Semiconductor Test System05 July 2012 - The TS-900 Semiconductor Test System from Geotest is now available with a new manipulator option and handler compatible receiver. The Reid-Ashman OM1069 manipulator is designed specifically for the TS-900 and allows precise positioning and flexibility for interfacing to automated probers and device handlers. The manipulator's spring loaded design allows for easy alignment and docking to handlers – eliminating the need for a complex receiver interface. New 4-channel, compact, USB Oscilloscopes05 July 2012 - The PicoScope 3000 Series of high-performance oscilloscopes has been expanded to include six new 4-channel models. The new oscilloscopes offer a maximum sampling rate of 1 GS/s (up to 10 GS/s effective for repetitive signals), a range of input bandwidths from 60 MHz to 200 MHz, and buffer memory depths from 4 M to 128 M samples. The new FlexiPower system allows the scopes to run on either USB or AC power. Test Digital Communications Systems at Rates up to 32 Gb/s04 July 2012 – Agilent Technologies introduced two new test applications that leverage the high bandwidth and low jitter performance of the Infiniium 86100D DCA-X oscilloscope. Agilent N1012A compliance test software is the industry’s first automated application for the Optical Internetworking Forum’s Common Electrical Interface (OIF CEI) 3.0 Implementation Agreement. Agilent N1019A user-defined application, on the other hand, enables engineers to rapidly develop their own automated test applications. Both software packages help developers save time and money. Geotest introduces 6.5 Digit PXI DMM03 July 2012 - Geotest introduced their new 6.5 digit PXI digital multimeter. The GX2065 offers a unique combination of features, resolution, accuracy and speed in a compact, single slot 3U PXI format. Featuring 6-½ digit resolution, 0.005% basic DCV reading accuracy and up to 3,500 reading per second (rps) provides measurements that are accurate, fast and repeatable. All measurement functions including digitizing functions are isolated from the PXI bus – providing the ability to make true differential, floating measurements. An on-board controller performs all necessary DMM and digitizer calculations, minimizing PXI control bus overhead. New Generation of Handheld Cable and Antenna Analyzer03 July 2012 - Anritsu introduces the Site Master S331L Cable and Antenna Analyzer, a new generation of rugged handheld field instrumentation that builds off the field-proven design and success of the Site Master to provide high-performance cable and antenna analysis quickly and accurately. Reliable, durable, easy-to-use, and offering eight hours of continuous battery life, the S331L is a cost-efficient tool for tower contractors, installation and maintenance contractors, and wireless service providers to ensure optimum deployment, installation, and maintenance of wireless networks. Hua Hong NEC and Advantest Develop Wafer-Level Test Solution for RFID Devices02 July 2012 - Shanghai Hua Hong NEC Electronics and Advantest have collaborated to successfully develop a wafer-level, multi-site parallel test solution for radio-frequency identification (RFID) semiconductor devices that meet industry-standard ISO 14443 guidelines. This new test methodology is now being used to improve the cost efficiency of volume-production testing at Hua Hong NEC and, most importantly, has already met with approval from the foundry’s key customers. Orbotech expands Ultra Fusion AOI Series29 June 2012 – Orbotech announced that it has expanded its Ultra Fusion series of automated optical inspection (AOI) systems. The new Ultra Fusion 300 is designed to support the production of advanced IC substrates down to 10μm. In addition to Ultra Fusion 300, the Company also offers the recently launched Ultra Fusion 200 for IC substrate and advanced HDI production down to 15μm. More Articles ...
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