Latest Test and Measurement News

Test Vector Interface for IEEE1450 (STIL)

09 July 2010 - GOEPEL electronic introduces a new test vector interface as a new extension of its software platform SYSTEM CASCON. The newly developed vector link is based on IEEE1450 – Standard Test Interface Language (STIL) – and enables the seamless coupling during test pattern export, in particular to chip testers.

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Fluke unites its calibration product groups under a new brand

21 July 2010 - Fluke Corporation announced it is consolidating its six calibration product lines under a single logo - Fluke Calibration. The change represents the unification of Fluke Calibration’s measurement disciplines, including electrical, RF, temperature, pressure, flow, and calibration software.
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Desktop RF diagnostic chamber

21 July 2010 - The compact R&S DST200 RF diagnostic chamber of Rohde & Schwarz makes it easy for developers of wireless devices such as mobile phones to perform reproducible radiated RF measurements on the workbench. The benchtop chamber simulates conditions that approximate free space and features a 700 MHz to 6 GHz broadband test antenna especially designed for the chamber.
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National Instruments expands Embedded Vision System Offerings

20 July 2010 – National Instruments today announced the addition of Windows OS support and Camera Link connectivity for NI Embedded Vision Systems, providing manufacturing engineers and system integrators three new options to develop high-performance machine vision solutions.
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Vi TECHNOLOGY launches the REVEAL Imager AOI Series

14 July 2010 – Vi TECHNOLOGY introduces the REVEAL Imager Series, at SEMICON West 2010 from July 13th to 15th, Booth 5377 - North Hall – San Francisco Moscone Center. Along with the product an automatic JEDEC Tray loader compatible with both REVEAL Imager and REVEAL MEMS Series will be demonstrated.
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Orpro Vision appoints distributor for Czech Republic and Slovakia

12 July 2010 - ORPRO Vision GmbH, a manufacturer of AOI systems for the global electronics industry, has appointed Elmatest as distributor for Czech Republic and Slovakia to consolidate its presence in Europe.
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Optical Inspection System for Automated Conformal Coat Inspection

05 July 2010 - GOEPEL electronic offers a system for the automated optical inspection of fluorescing conformal coating. The TOM system (Teachable Optical Measurement) can be utilised for inspection of PCB coatings as well as PCB areas, which mustn’t be coated. The maximum PCB size is 460 X 400 mm.
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Direct-ProbeTM Solution for Verigy V93000

World's first signal and real-time spectrum analyzers up to 30 GHz

Rohde & Schwarz enters the oscilloscope market

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Readers Top 5 News of last 30 days

Latest Test and Measurement News

Test Vector Interface for IEEE1450 (STIL)

Fluke unites its calibration product groups under a new brand

Desktop RF diagnostic chamber

National Instruments expands Embedded Vision System Offerings

Vi TECHNOLOGY launches the REVEAL Imager AOI Series

Orpro Vision appoints distributor for Czech Republic and Slovakia

Optical Inspection System for Automated Conformal Coat Inspection

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