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Latest Test and Measurement NewsTektronix Raises Bar for Oscilloscope Sampling Rates, Signal Integrity21 October 2010 – Tektronix announced the DPO/DSA/MSO70000C Series of digital and mixed signal oscilloscopes that now deliver 100 GS/s sampling rate performance; enabling lower noise along with increased data points on 5x oversampled 20 GHz acquisitions. This over-sampling performance in a high bandwidth oscilloscope delivers significant real-world benefits including more accurate signal integrity measurements for such high-speed serial standards as PCI Express Gen 3. Other enhancements include a new, faster compute platform and a more stable timebase, ideal for radar applications. Serial Data Decode and Debugging for Oscilloscopes20 October 2010 - LeCroy Corporation strengthened its powerful portfolio of decode options with the addition of six new serial data decoders - ARINC 429, USB 2.0, MIPI D-PHY (including CSI-2 and DSI) and DigRF 3G decoders. Additionally, a new PROTObus MAG (Measure, Analysis, Graph) Serial Debug Toolkit is also now available. Mains and Harmonics Compliance Analyzer for Lighting Equipment Tests20 Ocotber 2010 - The TTi HA1600A mains and harmonics analyzer has been updated to include a full implementation of the two alternative special assessments for Class C Discharge Lighting equipment below 25 W, as specified in EN61000-3-2. The requirements of this standard include the measurement and display of the phase angles where current conduction starts and stops, and the phase angle of the last peak of the current waveform in each half-cycle. It also provides for a 'no limits below' threshold in Class C (standard lighting equipment) measurements, with a default value of 25 W. LXI RF and Universal Frequency Counter/Timers19 October 2010 - Agilent Technologies Inc. introduced the Agilent 53200 RF and universal frequency counter/timer series, the first frequency counters with LXI Class C compliance. The Agilent 53200 RF and universal frequency counter/timer series offers base bandwidth of 350 MHz with options to extend up to 15 GHz. Measurement reading speed has increased by more than two orders of magnitude from the previous generation. New Current Probes deliver unprecedented measurement flexibility19 October 2010 – Fluke Corporation has introduced new iFlex™ flexible current probes, designed to make current measurement easier, more convenient and more precise for electricians and industrial technicians. The new Fluke iFlex flexible current probes expand the measurement range of select Fluke meters to 2500 A ac and give technicians the ultimate in measurement flexibility. National Instruments to Add LTE Automated Test Capabilities18 October 2010 – National Instruments will be adding Long Term Evolution (LTE) test capabilities to its RF test product portfolio with the forthcoming NI LTE Measurement Suite, which operates with PXI RF signal generators and analyzers. NI engineers will demonstrate the new LTE Measurement Suite at the 2010 4G World conference in Chicago on October 20–21. Agilent Technologies Debuts PXI-Based Digital Multimeters15 October 2010 - Agilent Technologies Inc. introduced two digital multimeters (DMMs) to complement its growing family of PXI products. These new 6.5 digit PXI DMMs offer the industry’s highest measurement speeds within their price range, along with excellent accuracy and stability. Test engineers in aerospace, defense, electronic manufacturing and automotive industries now have an alternative when designing their mission-critical PXI test systems. More Articles ...
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