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Latest Test and Measurement NewsNI LabVIEW 2010: New Functions and Faster Code Execution
Handheld Spectrum Analyzer Makes Infield Measurements Easier
XJTAG supports Micron Phase Change Memory23 July 2010 - XJTAG announced that it is the first to provide support for Micron Omneo™ Phase Change Memory (PCM). XJTAG provides test and development tools for high speed programming of Micron Phase Change Memory. Also XJTAG produces white paper on high speed programming of non-volatile Memories. Test Vector Interface for IEEE1450 (STIL)09 July 2010 - GOEPEL electronic introduces a new test vector interface as a new extension of its software platform SYSTEM CASCON. The newly developed vector link is based on IEEE1450 – Standard Test Interface Language (STIL) – and enables the seamless coupling during test pattern export, in particular to chip testers. Fluke unites its calibration product groups under a new brand21 July 2010 - Fluke Corporation announced it is consolidating its six calibration product lines under a single logo - Fluke Calibration. The change represents the unification of Fluke Calibration’s measurement disciplines, including electrical, RF, temperature, pressure, flow, and calibration software.
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03 August 2010 – National Instruments announced LabVIEW 2010, the latest version of the graphical programming environment for design, test, measurement and control applications. LabVIEW 2010 delivers time savings with new features such as off-the-shelf compiler technologies that execute code an average of 20 percent faster and a comprehensive marketplace for evaluating and purchasing add-on toolkits for easily integrating custom functionality into the platform.
03 August 2010 - Agilent Technologies introduced the N9342C handheld spectrum analyzer (HSA), a powerful and straightforward instrument designed for RF technicians and engineers performing installation, maintenance and surveillance of RF systems in the field. The N9342C HSA makes field testing easier by providing faster, more precise measurements, ease of use, and a range of user customization and ergonomic features.
Desktop RF diagnostic chamber
National Instruments expands Embedded Vision System Offerings