|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
Readers Top 5 News of last 30 days
Latest Test and Measurement News
High-Density 2 Amp PXI Multiplexers
31 January 2017 - Pickering Interfaces expanded their range of High-Density 2 Amp PXI Multiplexers. This new range of High-Density 2 Amp PXI Multiplexers (40-614 family), available in 20 different configurations, was designed for signal routing in Automatic Test Equipment (ATE) and data acquisition systems. The range uses high-quality electromechanical signal relays allowing each channel to switch current up to 2 Amps and voltage up to 200VDC/140VAC.
Circuit Check and ASSET InterTech collaborate on Boundary-Scan Test Solutions
30 January 2017 - Circuit Check Inc. announced a collaboration with ASSET InterTech to more closely integrate ASSET’s ScanWorks boundary-scan test tools with CCI’s flexible, configurable functional test systems, the CCI 1000 Series Configurable ATE and CCI 6000 Series Rotary Handler.
New 4-in-1 Hipot and Savety Testers
27 January 2017 - Associated Research announced the addition of two new Models to their HypotULTRA series. The new HypotULTRA models feature 4-in-1 test functionality that includes AC Hipot, DC Hipot, Insulation Resistance, and Ground Bond testing in a slim lightweight and functional design. These new models raise the standard for production line Hipot and Ground Bond testing and make it easier for manufacturers to adopt best testing practices without sacrificing productivity.
Automated 100G Electrical Test Solutions
26 January 2017 – Tektronix introduced new equivalent time automated compliance test solutions for 4-lane 100G electrical interfaces defined in the IEEE 802.3bm and 802.3bj specifications. The new capabilities along with the full set of Tektronix solutions for 100G and 400G characterization and validation will be demonstrated February 1-2 at DesignCon 2017, Booth 741.
Fiber-Optically Isolated High Voltage Probe
25 January 2017 - Teledyne LeCroy announced the new HVFO high voltage fiber-optically isolated oscilloscope probe. The HVFO probe is optimized for measurement of small signals floating on a HV bus in power electronics designs. Optical isolation between the probe tip and the oscilloscope input reduces adverse loading of the device under test (DUT); and also reduces noise, distortion, ringing, overshoots, and transients on the measured signal.
Lock-in Amplifier with optional Quad-PID Feedback Loop
24 January 2017 - Zurich Instruments added the MF-PID option with 4 independent PID (proportional - integral - derivative) controllers to their MFLI, a 500 kHz / 5 MHz lock-in amplifier. The MF-PID option builds on class-leading specifications of the MFLI such as low input noise of 2.5nV/√Hz and a high dynamic reserve of 120 dB. Each controller is seamlessly integrated with the lock-in amplifier, using inputs from a multitude of internal measurement data and analog input signals. The maximum control loop bandwidth is 50 kHz.
High Resolution LXI Digitizers with up to 24 Channels
23 January 2017 - Spectrum GmbH released a range of high-speed 14- and 16-bit LXI-based digitizer products for applications where multiple electronic signals need to be acquired and analyzed. Twelve new instruments with up to 24, fully synchronized channels extend Spectrum's digitizerNETBOX family. The 16-bit ADC models offer sampling rates of either 130 MS/s or 250 MS/s, while the 14-bit units feature sampling rates of 500 MS/s.
More Articles ...
Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
RSS FeedSubscribe to RSS Feed
© All about Test 2016