|
||||
| News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement NewsCompact 6-20GHz Spectrum Analyzer
Test System for Automotive Radar Sensors
Oscilloscope based DisplayPort 2.0 PHY Test Solution
Sampling Oscilloscope offers PAM4 Evaluation Functions
Vector Network Analyzer with intuitive Operating Concept
Mek (Marantz Electronics) appoints Sales Engineer for North America22 July 2021 - Mek (Marantz Electronics), a provider of Automatic Optical Inspection solutions and Solder Paste Inspection systems, appointed Austin Jones as new Sales Engineer for the North American geographic region. In his new position Austin will be based in Florida, report directly to MEK Europe and work side by side with the sales rep network. Metrology Platform for Semiconductor Manufacturing Processes
More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
RSS Feed
Subscribe to RSS Feed
Social Media
|
||
|
© All about Test 2018 |
||||
How to resolve AdBlock issue? 
29 July 2021 - Saelig Company added the SAF Tehnika J0SSAP52 6GHz-20GHz Spectrum Compact Analyzer to its portfolio. This ultra-portable handheld microwave spectrum analyzer supports 6GHz – 20GHz frequencies with a high sensitivity of -110dBm at 30kHz resolution bandwidth, and an instant-on functionality for quick start-up and operation. This high-performance instrument, which rivals desktop units, is designed in a rugged, IP54-rated, ultra-compact (5.31” x 3.27” x 1.34”) and lightweight (20oz) form factor.
28 July 2021 - The new R&S RTS radar test system from Rohde & Schwarz simulates driving scenarios for testing radar based advanced driver assistance systems (ADAS) and radar sensors used in autonomously driving cars (AD) entirely over the air. The test solution consists of the new R&S AREG800A automotive radar echo generator as a backend and the R&S QAT100 antenna array as a frontend.
27 July 2021 – Teledyne LeCroy furthers its leadership in DisplayPort testing with with QualiPHY DisplayPort 2.0 source and sink compliance and DisplayPort AUX DME (Decode, Measure & Eye Diagram) oscilloscope software options. The new solution builds on the recently announced DisplayPort 2.0 Link Layer compliance test solution integrates BER test (BERT) with automated compliance and adds analysis of multi-lane 20 Gb/s video links.
26 July 2021 – Anritsu extended its BERTWave Sampling Oscilloscope MP2110A with the Signal Processing Software Option-098 which adds upgraded functions for evaluating PAM4 differential electrical signals. The new option supports standards-compliant measurement of IEEE 802.3 optical-module electrical interfaces, speeding up communications in data centers and mobile networks by upgrading evaluation efficiency for 50 to 400G optical modules using PAM4 technology.
23 July 2021 - SIGLENT Technologies presented its first 2- or 4-port vector network analyzer SNA5000A. This innovation is an important and significant step for Siglent as the SNA increases Siglent’s product breadth and is the first family of products introduced in the new “A-Line”. This is expressed by the new suffix "A" at the end of each model number. Several more A-series devices will follow in the next 18 months.
21 July 2021 – Atonarp, a manufacturer of molecular sensing and diagnostics products for the semiconductor, healthcare, and pharma industries, announced Aston, an innovative in-situ semiconductor metrology platform with an integrated plasma ionization source. Aston is a major evolution in metrology for semiconductor production processes, enabling in-situ molecular process control and allowing existing fabs to run more efficiently, driving higher output.