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Readers Top 5 News of last 30 days
- 22 October 2018 - Development Solution for Software Debugging over the XCP Protocol
- 18 October 2018 - AOI and SPI Systems with self-programming Inspection Software
- 26 October 2018 - Programmable Resistor Modules targeting ECU Testing
- 23 October 2018 - Collaboration for TC8 Automotive Ethernet Testing
- 30 October 2018 - Yokogawa launched new Mixed Signal Oscilloscopes
Latest Test and Measurement News
In-line Inspection of LED Lights up to 2000 mm
07 September 2018 – For extra-long electronic assemblies, Viscom offers inspection solutions that realize demanding handling tasks without a problem. Their high inspection accuracy, wide inspection scope and rapid inspection speed predestine the 3D AOI and 3D SPI systems from Viscom for high-end electronics – particularly for LED lights.
Protocol Test System supports 5G New Radio (NR)
06 September 2018 – Anritsu Corporation introduced the ME7834NR test system supporting Protocol Conformance Testing (PCT) and Carrier Acceptance Testing (CAT) of terminals incorporating the 5G New Radio (NR) technology. The ME7834NR will add support for 3GPP TS 38.523 test cases for all configurations of 5G NR, including both Non-Standalone (NSA) and Standalone (SA) modes.
Semiconductor Test Handler with Double Device Detection and Automatic Temperature Calibration
05 September 2018 - Xcerra has added two new optional features to the MT2168 XT pick-and-place handler. Both options target optimization of test floor processes, allowing the customer to deliver enhanced quality: the Double Device Detection (DDD) option increases binning integrity; the Automatic Temperature Calibration enables the customer to meet quality standards by calibrating as scheduled without time consuming manual processes.
Four-channel Click Analyzer with integrated LISN and full CISPR Calibrator
04 September 2018 - Narda STS (Formely PMM) released the CA0010 click (discontinuous disturbance) analyser to accompany their 9010F FFT EMI receiver. This click analyser is capable of four simultaneous measurements at the frequencies of 150 kHz, 500 kHz, 1,4 MHz and 30 MHz and can work as a standalone setup for fully compliant CISPR 14-1 testing.
Wideband I/Q Data Recorder enables realistic Device Tests in the Lab
03 September 2018 - The R&S IQW wideband I/Q data recorder of Rohde & Schwarz can be used to record signal scenarios typically required in test cases at a bandwidth up to 512 MHz and high sampling rates. The solution records wideband RF signals and reproduces them to simulate real-world test environments, enabling realistic, repeatable device tests in the lab.
Evaluation of Sub-6 GHz New Radio (NR) Terminals
31 August 2018 – Anritsu announced the release of two new software options for evaluating 3GPP-compliant 5G Sub-6 GHz New Radio (NR) terminals, expanding the range of software options for the Universal Wireless Test Set MT8870A. The new software packages support fully automatic and industry-fastest Non-Signalling 3GPP-defined 5G NR Sub-6 GHz TRx tests, helping to facilitate the smooth rollout of 5G services by improving the mass-production of terminals and chipsets.
Analyzing 5G New Radio Uplink Signals
30 August 2018 - Rohde & Schwarz introduced a new solution for analyzing 5G NR uplink signals in line with the latest 3GPP specifications. The R&S FSW-K145 5G-NR UL measurement application for the R&S FSW signal and spectrum analyzer is used to develop 5G user equipment and components such as power amplifiers. It complements the existing R&S FSW-K144 5G NR downlink measurement application, which is used to test 5G base stations.
More Articles ...
- New PXI RF and Microwave Switches
- Ultra-fast Measurement of spatial Light Distribution
- WEETECH expands its sales network in Europe
- eSIM OTA Test Solution Verification for ERA-GLONASS
- Battery Capacity Analyzer for sealed Lead Acid Batteries
- Reproducible Disturbances of CAN (FD) Networks
- Self-Programming 3D Inspection Software for SPI and AOI
- Attach USB Test Devices and Equipment directly to a PXIe Chassis
- Tri-Temperature Test of LED Devices in Volume Production
- Keysight Technologies acquired Thales Calibration Services
- SAS 4.0 Analyzer/Exerciser/Jammer supports complete End-to-End Testing
- Signal Analyzer with Support for 5G NR Analysis
- 12.8 Gbps SerDes Test Instrument with high Channel Density
- Production Tester for Automotive Radar Sensors
- Protocol Analyzer supports PAM4 50G-400G Ethernet
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