Latest Test and Measurement News

IPTE expands Sales across Europe

25 October 2018 - IPTE, a supplier of automated production equipment for the electronics and mechanics industry, expands its sales activities in four European regions. A new sales representative each has started in Germany, France, and Hunga-ry/Romania as well as for the Nordic countries.

DisplayPort 1.4 Test Solutions for DSC and FEC

TLC 980R 24 October 2018 – Teledyne LeCroy announced enhancements to its suite of DisplayPort 1.4 display stream compression (DSC) and forward error correction (FEC) test solutions. The new 980 DisplayPort 1.4 Video Generator / Analyzer module now supports the industry’s first DSC/FEC video generator and additional link-layer compliance tests for FEC, main link audio, video and power management.

Collaboration for TC8 Automotive Ethernet Testing

23 October 2018 - Rohde & Schwarz and Spirent announced a new partnership to provide an unrivaled, fully integrated test solution, offering full coverage of both the physical and protocol layers for automotive Ethernet TC8 ECU test specifications. As members of the OPEN Alliance (One-Pair Ether-Net) Special Interest Group (SIG), both companies have been working closely with the industry and have joined forces to develop tailored solutions to address the challenges that the emerging technologies bring.

Development Solution for Software Debugging over the XCP Protocol

Vector Lauterbach 22 October 2018 – Vector and Lauterbach are offering an integrated solution for ECU software development based on the new ASAM standard “Software Debugging over XCP”. It eliminates the need to repeatedly switch between hardware for measurement, calibration, and debugging.

Optimized Troubleshooting in Multi-Chip Systems

pls 03 target adapter 19 October 2018 – With the new Multi-Target Debug Adapter suitable for the Universal Access Device 3+ (UAD3+) of the Universal Debug Engine (UDE), PLS Programmierbare Logik & Systeme presents at electronica 2018 in Hall B4, Booth W22, the first tool that allows synchronous debugging of multi-chip systems. PLS’s modular Multi-Target Debug Adapters support various high-performance systems with two separate microcontrollers on one board, which enable redundant and, where appropriate, inverted control algorithms.

AOI and SPI Systems with self-programming Inspection Software

Saki AOI 18 October 2018 - Saki Corporation presented its new 3Di Automated Optical Inspection (AOI) system at SMTA International trade fair. Saki's 3Di Series is the fastest AOI system in the industry. It has scalable resolutions of 7µm, 12µm, and 18µm, closed-loop functionality, and a sturdy frame with a dual-drive system, resulting in accuracy, stability, and reliability.

6,5 Digit Dual Measurement Multimeter

GWInstek GDM 906X 17 October 2018 - GW Instek launched the GDM-906X series 6 ½ digit dual measurement multimeter (2 models: GDM-9061 and GDM-9060), featuring high precision DC voltage accuracy, fast sampling rate, 12 measurement functions, 6 mathematical functions (dB/dBm/Compare/ MX+B/Percent and 1/X) as well as a variety of communications interfaces (USB device/host, RS-232C, LAN, digital I/O and optional GPIB) to provide comprehensive measurement capabilities, higher speed and accuracy.

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Readers Top 5 News of last 30 days

Latest Test and Measurement News

IPTE expands Sales across Europe

DisplayPort 1.4 Test Solutions for DSC and FEC

Collaboration for TC8 Automotive Ethernet Testing

Development Solution for Software Debugging over the XCP Protocol

Optimized Troubleshooting in Multi-Chip Systems

AOI and SPI Systems with self-programming Inspection Software

6,5 Digit Dual Measurement Multimeter

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