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Readers Top 5 News of last 30 days
- 07 March 2019 - Multi-Channel LoRa Tester for Transmitter and Receiver Tests
- 13 March 2019 - Dual Channel 44 GHz Vector Signal Generator with 2 GHz Bandwidth
- 28 February 2019 - New CAN (FD)/LIN Network Interface for PCIe
- 05 March 2019 - Software Solution improves Control over Lab Instruments
- 27 February 2019 - Multi-Site Test of Automotive and Industrial Power Devices
Latest Test and Measurement News
Testing DDR4 Memory on Prototypes and Production PCBs
14 January 2019 – Engineers designing with Double Data Rate 4 (DDR4) memory devices can quickly deploy tests for shorts and opens on control, address and data lines with the boundary scan test (BST) tools of ASSET InterTech’s ScanWorks platform for fast test and programming.
Keysight launched new Service Model
11 January 2019 - Keysight Technologies announced KeysightCare, a new service model that offers design and test engineers dedicated, proactive support for instruments, software, and solutions. KeysightCare offers access to a range of resources and is available in three service levels.
Advantest acquires Semiconductor System Level Test Business from Astronics Corporation
10 January 2019 – Advantest Corporation entered into a definitive agreement under which Advantest will acquire the commercial Semiconductor System Level Test business (“Test Systems”), a provider of system level test for semiconductor components and modules, from Astronics Corporation for $185 million, plus an earn-out payment of up to $30 million based on certain performance milestones.
Signal Generators for testing Automotive eCall-Systems
09 January 2019 - In cooperation with TeleOrbit and TeleConsult Austria IZT expanded the capabilities of its Signal Generators. For testing eCall systems the IZT S1000 / IZT S1010 Signal Generator can be combined with the GIPSIE software which was developed in cooperation with TeleOrbit and TeleConsult Austria. The solution offers a compact multi-channel high-performance platform for complex and versatile testing in one device.
Compact JTAG/Boundary Scan Desktop Test System
08 January 2019 - GOEPEL electronic has launched the third generation of its compact JTAG/Boundary Scan test and programming system JULIET. The new SERIES 3 now offers current and voltage measurement, discharge function and full support for the emulation technology VarioTAP among other things.
DisplayPort Verification Module with USB-C/eDP Support
07 January 2019 – Teledyne LeCroy announced its new 980 DisplayPort (DP) 1.4 USB-C/eDP Video Generator/Analyzer module, the industry’s first High Bit Rate 3 (HBR3) and Display Stream Compression (DSC) capable solution with USB-C support. The new module is designed to help developers in R&D and silicon manufacturing greatly simplify and improve verification for two growing Technologies - USB-C DisplayPort: Alt Mode negotiations and the Embedded DisplayPort (eDP) interface.
Test Automation Platform certified for Medical Software Engineering
20 December 2018 – VectorCAST, Vector's test automation platform, has been certified according to IEC 62304:2015 for medical software engineering. TÜV SÜD confirms that the development was performed in accordance with the life cycle processes for medical device software. As part of the recertification of IEC 61508, EN 50128 and ISO 26262, the TÜV SÜD certificate was extended to include the international standard IEC 62304 for the development of software for medical devices.
More Articles ...
- High Precision Dual-Channel DC Power Supply
- Direction-finding Antenna for locating Signal Sources
- Fast Production Test of UV-LEDs
- Stand-alone AOI System with 3D Camera Module
- Parametric Testing for Developing and Manufacturing Next-Generation ICs
- New Features and Functionality for NI LabVIEW NXG
- All-in-One 400GbE PAM4 BER Measurements
- Dual-Channel, Multi-Function Arbitrary Waveform Generators
- E-Mobility Tester offers combination of high and low voltage test
- Digital Oscilloscopes featuring 7 Measurement Functions
- JTAG/Boundary Scan Controller for Industrial Production Use
- Test of High-Voltage Semiconductors
- Test Solution for Radiation Measurements on 5G Devices
- Test Handler offers PCB Exchange within less than four Seconds
- Isolated High Voltage 4-Ch 200MHz Oscilloscope
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