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Readers Top 5 News of last 30 days
- 07 March 2019 - Multi-Channel LoRa Tester for Transmitter and Receiver Tests
- 13 March 2019 - Dual Channel 44 GHz Vector Signal Generator with 2 GHz Bandwidth
- 28 February 2019 - New CAN (FD)/LIN Network Interface for PCIe
- 05 March 2019 - Software Solution improves Control over Lab Instruments
- 27 February 2019 - Multi-Site Test of Automotive and Industrial Power Devices
Latest Test and Measurement News
High Precision Dual-Channel DC Power Supply
19 December 2018 - GW Instek launched the PPH-1506D/1510D programmable high precision dual-channel DC power supply. The high precision measurement capability of both PPH-1506D and PPH-1510D achieves the maximum resolution of 1mV/0.1μA and the smallest pulse current width of 33μs that satisfy customers’ measurement application requirements of high resolution and pulse current.
Direction-finding Antenna for locating Signal Sources
18 December 2018 – Narda Safety Test Solutions developed an automatic direction-finding antenna (ADFA) that delivers incomparably stable results extremely quickly. Highly insensitive to reflections, it precisely and reliably determines the direction of a detected signal. Coupled with the SignalShark real-time receiver it leads to a system for automatic direction-finding of signals in the frequency range from 200 MHz to 2.7 GHz.
Fast Production Test of UV-LEDs
17 December 2018 – Within its well-established CAS-series of spectroradiometers, Instrument Systems has developed a novel series-type CAS 140D-157. This new system measures precisely and reliably not only within the visible spectrum, but also in the UV. Coupled with a PTFE-coated integrating sphere, the system permits for fast 24/7 production tests of UV emitters to be run.
Stand-alone AOI System with 3D Camera Module
14 December 2018 - The stand-alone AOI system "Basic Line" of Goepel electronic can now be equipped with a new 3D camera module. This allows cost-effective 3D measurement and 2D inspection even for SMD manufacturers with small batch sizes. The 3D ViewZ camera module combines 3D measurement technology based on structured light with angled-view inspection from 360 possible angles, allowing maximum fault detection even in difficult-to-view component situations.
Parametric Testing for Developing and Manufacturing Next-Generation ICs
13 December 2018 – Advantest introduced its new V93000 SMU8 parametric tester to meet chip makers’ process-characterization and monitoring needs for the exacting measurements required on the 28 nm to 3 nm process nodes and beyond. With per-pin source measurement units (SMU) for next-generation DC parametric testing, the system allows users to quickly measure and verify electrical and timing characteristics at any device pin, thereby enabling more cost-efficient manufacturing and faster time to market for new IC designs.
New Features and Functionality for NI LabVIEW NXG
12 December 2018 – National Instruments (NI) announced a new release of LabVIEW NXG, demonstrating continued investment in the next generation of LabVIEW engineering system design software. The newest version of LabVIEW NXG includes new fast, flexible and web-ready features and simplifies the most time-consuming tasks in automated test and automated measurement applications.
All-in-One 400GbE PAM4 BER Measurements
11 December 2018 - Anritsu released a 64-Gbaud PAM4 Pulse Pattern Generator (PPG) and 32-Gbaud PAM4 Error Detector (ED). This PAM4 BERT supports 400GbE testing when these modules are installed in the Anritsu Signal Quality Analyzer-R MP1900A series to implement a bit-error-rate test solution with best-in-class signal level quality and excellent Rx sensitivity for next-generation broadband communication systems.
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- Dual-Channel, Multi-Function Arbitrary Waveform Generators
- E-Mobility Tester offers combination of high and low voltage test
- Digital Oscilloscopes featuring 7 Measurement Functions
- JTAG/Boundary Scan Controller for Industrial Production Use
- Test of High-Voltage Semiconductors
- Test Solution for Radiation Measurements on 5G Devices
- Test Handler offers PCB Exchange within less than four Seconds
- Isolated High Voltage 4-Ch 200MHz Oscilloscope
- Protocol Analyzer supports MIPI CSI-2 and MIPI DSI-2 over C-PHY or D-PHY
- Pattern Conversion Software for Cloud-Based Semiconductor Testing
- Arbitrary Function Generator Series with 16 Bit Resolution
- New Data Acquisition System automates and rapidly validates Designs
- Counter Quantum Analyzer for Parallel Readout of 10 Qubits
- Imaging Automotive Radome Tester
- Cellular Vehicle-to-Everything and Advanced Automotive Ethernet Test Solutions
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