|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Signal Analysis Solution with 800 MHz Real-Time Bandwidth
11 January 2017 - Tektronix announced the RSA7100A wideband signal analysis solution that combines 800 MHz of real-time bandwidth with up to 2 hours of streaming storage at full bandwidth in one solution. The new instrument's 16 kHz to 26.5 GHz frequency range covers a broad range of analysis needs for critical wide-bandwidth applications.
Corelis launched new Version of Boundary-Scan Tool Suite
10 January 2017 – Corelis announced the availability of version 8.4 of its ScanExpress Boundary-Scan Tool Suite. The new software update features a new ScanExpress TPG Cluster Wizard for logic cluster test creation, support for dynamic JTAG controller GPIO control in ScanExpress Debugger, multiple user interface enhancements for ScanExpress Viewer, four new design-for-testability (DFT) reports, support for three new processors for ScanExpress JET, plus numerous improvements spanning the complete suite of ScanExpress software applications.
Effective Location of External PIM Sources
09 January 2017 – Anritsu expands its field test portfolio with the introduction of PIM Hunter, a passive intermodulation test probe that helps field technicians more quickly discover the precise location of external PIM sources at cell sites. Designed for use with Anritsu’s PIM Master, Spectrum Master and BTS Master handheld analyzers, the PIM Hunter test probe enables field professionals to use traditional interference hunting techniques to accurately locate external PIM sources for optimum wireless network performance.
Sensor Test Module for Twin Axis Stimulation
22 December 2016 - Multitest shipped a new “Shaker” high g sensor test module for the MT9928. The module allows for twin axis testing in one stimulation on the x and z axis. The module expands the MEMS/sensor test portfolio for the flexible and modular MT9928 handler platform, which already includes multiple solutions for test and calibration of inertial MEMS/sensors.
Modular PXIe Digitizers for Wideband Applications
21 December 2016 - Spectrum GmbH expanded its line of PXIe-based (PXI Express) high-speed digitizers with nine new cards. The new M4x.22xx series includes modules that offer one, two or four fully synchronous channels. Each channel is equipped with its own analog-to-digital converter (ADC) with real-time signal sampling at rates from 1.25 GS/s to 5 GS/s and scope-like signal conditioning circuitry that allows programming of parameters such as input gain, signal offset and coupling.
Digital 100 MHz Multifunction-Oscilloscope
20 December 2016 - The new PeakTech 1360 digital storage oscilloscope features 12-bit vertical resolution and a fast waveform update rate as well as a 20 cm (8 ") TFT Touchscreen display with 800x600 pixels. In addition to the 2-channel oscilloscope a full digital multimeter with voltage, current, resistance and capacitance measuring range is integrated in the device. Additionally arbitrary waveforms can be outputted with the integrated 25MHz waveform generator.
400G PHY Layer PAM4 Transmitter Validation
19 December 2016 - Tektronix released an update to its PAM4 solution for validating 400G physical layer transmitter designs for its DPO70000SX oscilloscope series. The latest release adds PAM4 error detection, industry-leading Signal to Noise and Distortion Ratio (SNDR) measurement capability, and new advanced FFE/DFE equalization capabilities into one easy to use solution.
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Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
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