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Readers Top 5 News of last 30 days
- 07 March 2019 - Multi-Channel LoRa Tester for Transmitter and Receiver Tests
- 13 March 2019 - Dual Channel 44 GHz Vector Signal Generator with 2 GHz Bandwidth
- 28 February 2019 - New CAN (FD)/LIN Network Interface for PCIe
- 05 March 2019 - Software Solution improves Control over Lab Instruments
- 27 February 2019 - Multi-Site Test of Automotive and Industrial Power Devices
Latest Test and Measurement News
Dual-Channel, Multi-Function Arbitrary Waveform Generators
10 December 2018 – Teledyne LeCroy announced a family of High Definition arbitrary waveform generators (AWGs). The dual-channel AWGs are branded T3AWG3252 (250 MHz) and T3AWG3352 (350 MHz) and offer 16 bits of vertical voltage resolution, an output voltage window of up to ±24 V, and waveform memory of up to 1 GS/channel.
E-Mobility Tester offers combination of high and low voltage test
07 December 2018 - WEETECH introduced the new W 484 PLUS test system, which combines an HV relay switching matrix with a cost-effective transistor switching matrix. Complex barriers can be avoided by monitoring the supplied energy. The compact W 484 PLUS high voltage tester tests high voltage cable harnesses and components used in electric or hybrid vehicles with up to 4,300 Vdc or 3,000 Vac.
Digital Oscilloscopes featuring 7 Measurement Functions
06 December 2018 - RIGOL Technologies announces an addition to its UltraVision II family of oscilloscopes with the introduction of the New MSO5000 Series Digital Oscilloscope. The MSO5000 Series offers bandwidth from 70MHz to 350MHz, 8GSa/sec sample rate, 500,000 wfms/sec waveform capture rate, and up to 200M Record Length. System performance, signal resolution and memory depth of the MSO5000 Series is unmatched in its class.
JTAG/Boundary Scan Controller for Industrial Production Use
05 December 2018 - The SCANFLEX II BLADE 4 RMxX of Goepel electronic is a new series of products of the JTAG/Boundary Scan controller platform SCANFLEX II. The controllers provide access to instruments already embedded in the DUT circuit to test and program complex boards with problematic physical access. SCANFLEX II BLADE 4 RMxX constitutes a uniform control platform with up to 12 independent, truly parallel Test Access Ports (TAP). The controllers are directly designed as 19" 1U plug-in units and are therefore particularly suitable for industrial production applications.
Test of High-Voltage Semiconductors
04 December 2018 – Advantest Corporation launched a new module for its EVA100 measurement system that enables testing of high-power ICs used in large-volume consumer applications. With the new HVI (high-voltage VI source and measurement) module, chip makers can ensure the reliability of power devices in widely used applications such as AC/DC and DC/DC converters, motor controllers, LED drivers and gate drivers by accurately measuring their current leakage and breakdown voltages.
Test Solution for Radiation Measurements on 5G Devices
03 December 2018 - Rohde & Schwarz demonstrated an innovative test system for conducting radiation measurements on 5G millimeterwave devices in the range from 20 GHz to 87 GHz using a compact antenna test range (CATR). The new solution will offer 5G RF engineers a great advantage, significantly accelerating time-to-market for 5G millimeterwave cellular devices.
Test Handler offers PCB Exchange within less than four Seconds
30 November 2018 - IPTE, a supplier of automated production equipment for the electronics and mechanics industry, has made its proofed and trusted Easy-Test-Handler ETH 25 per cent faster due to a new and more efficient spindle drive. Thanks to this new drive the cycle time is clearly faster.
More Articles ...
- Isolated High Voltage 4-Ch 200MHz Oscilloscope
- Protocol Analyzer supports MIPI CSI-2 and MIPI DSI-2 over C-PHY or D-PHY
- Pattern Conversion Software for Cloud-Based Semiconductor Testing
- Arbitrary Function Generator Series with 16 Bit Resolution
- New Data Acquisition System automates and rapidly validates Designs
- Counter Quantum Analyzer for Parallel Readout of 10 Qubits
- Imaging Automotive Radome Tester
- Cellular Vehicle-to-Everything and Advanced Automotive Ethernet Test Solutions
- Digitizers with ultra-long Signal Averaging Capabilities
- 5G NR OTA Measurement Solution
- Switching Current Measurement for Memory Test Systems
- Two 7½-digit Digital Multimeters in just 1U Rack Space
- Teledyne LeCroy presents first Teledyne Test Tools (T3)-Branded Products
- Smarter and Faster JTAG Test Development
- Handheld Microwave Spectrum Analyzers in 3 Models
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