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Readers Top 5 News of last 30 days
- 28 June 2017 - Power Measurement Software provides multi-unit PC Connectivity
- 05 July 2017 - Test and Measurement Solutions for E-Mobility
- 05 July 2017 - Signaling OTA Testing for IEEE 802.11 ac/n/a/g/b Devices
- 28 June 2017 - RF and Protocol Conformance Tests of 3GPP-Compliant LTE Mobile Terminals
- 28 June 2017 - Lilliput (OWON) launches new Spectrum Analyzer Series
Latest Test and Measurement News
Tektronix enters Vector Network Analyzer Market
02 May 2017 - Tektronix introduced the TTR500 Series USB Vector Network Analyzer, adding to the growing Tektronix portfolio of disruptive USB-based RF test instruments. Like Tektronix' highly successful USB-based spectrum analyzers, the new TTR500 Series delivers an unmatched combination of low price and performance – 40 percent lower cost than alternatives capable of matching its 122 dB dynamic range and 6 GHz frequency range. It also includes advanced features including new VectorVu-PC analysis software and the only built-in bias tee for testing active devices in this category.
1000Base-T1 Compliance Test Solution
28 April 2017 - Rohde & Schwarz introduced the R&S RTO-K87 option for the R&S RTO digital oscilloscope, the first compliance test software on the market for automated testing of IEEE 1000Base-T1 interfaces. Fast data transmission within automotive Ethernet networks is critical for driver assistance systems as well as for autonomous driving applications. Rohde & Schwarz has been an active participant in IEEE and OPEN Alliance, using its expertise to help drive the development of a reliable test solution.
Test Set for Bluetooth 5
27 April 2017 – Anritsu Corporation announced an upgrade to the MT8852B Bluetooth Test Set to support the latest Bluetooth Core Specification version 5. The MT8852B is a RF measuring instrument for design proving and production test of a wide range of products that integrate Bluetooth technology. It supports Basic Rate (BR), Enhanced Data Rate (EDR) and Bluetooth low energy (BLE) measurement of transmit power, frequency, modulation, and receiver sensitivity required by Bluetooth RF test specifications.
Pick-and-Place Handler with additional Temperature Control Features
26 April 2017 - The Multitest MT9510 pick-and-place handler is now available with an optional active socket purge (ASP). The ASP is another feature to support the excellent temperature performance of the well-established MT9510 test handler. By applying thermal controlled air flow to the pins the ASP keeps the temperature contact pin in the socket at the set test temperature. ASP provides optimum thermal energy to device under test and reduces the energy losses during test significantly.
Mek (Marantz Electronics) expands its Sales Network in Western Europe
25 April 2017 - AOI/SPI designer and manufacturer Mek (Marantz Electronics) announced the further expansion of its European sales network with the addition of a new distributor. SMT House (www.smthouse.com) will be representing Mek’s leading edge SPI and AOI technology in Germany, Switzerland and Austria, in response to growing demands in the region. SMT House offers a wide ranging platform of surface mount manufacturing equipment from high mix through high volume production.
Entry-level OTDR for testing “last mile” optical Access Networks
24 April 2017 - Yokogawa added an entry-level model, the AQ1000, to its range of OTDR (Optical Time-Domain Reflectometer) test instruments. The new instrument joins the existing mid-range AQ1200 series and the high-end AQ7280 series, and is specifically designed to increase the productivity of field personnel working on the installation and deployment of optical access networks such as Fibre to the Home (FTTH): the so-called "last mile" to consumers' premises.
AWG combines High Signal Fidelity and Scalability with Low Cost
21 April 2017 – Tektronix introduced a new arbitrary waveform generator (AWG) that offers high signal fidelity and scalability at an affordable price point to meet demanding signal generation needs in advanced research, electronic test, and radar and electronic warfare (EW) system design and test. The new AWG5200 series offers a 10 GS/s sample rate, 16-bit resolution and up to 8 channels per unit along with support for multiple unit synchronization.
More Articles ...
- Modular Probe system for Precision Measurements up to 9 GHz
- Test and programming Solutions for embedded Electronics
- Evaluation of IEEE802.11ac WLAN Devices
- Multi-Range DC Power Supplies with USB / Analog Remote Control
- Long-live Spring Probe with 500% for high Volume Production
- Entry-level Oscilloscope with 10-bit vertical Resolution and Touchscreen
- Pico Technology opened Office in China
- Highly automated Flying Probe Tester for PCBs
- ASK/FSK Demodulation Analysis Software for IoT Applications
- Embedded JTAG Solution for SPEA Flying Probe Tester
- 12-Bit Oscilloscopes feature Oversampling up to 10 GS/s
- Easy-to-use EMI Test Software
- Spectrum adds increased Sensitivity Option to its Digitizer Products
- LCR Meter with up to 1 MHz Test Frequencies and 0.05% Accuracy
- USB Sampling Oscilloscopes with up to 25 GHz Bandwidth
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