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Readers Top 5 News of last 30 days
News - Board and System TestPerformance Verification and Optimization of Wireless Networks25 January 2013 – Signalion launched its new product DTS-12. It is a simple and cost-efficient tool for performance verification and optimization of wireless networks by means of drive tests. DTS-12 provides a means to measure relevant cell parameters of up to 12 networks in parallel. GSM/EDGE, WCDMA, HSPA as well as LTE are supported and can be mixed ad libitum. Tetra and WiMax support is on the roadmap. Parallel Inline AOI for THT Components and THT Solder Joints25 January 2013 - GOEPEL electronic announced that the OptiCon THT-Line AOI system now provides a parallel inspection of THT components and THT solder joints. In a typical THT production line, now it is possible to inspect mounted components before the soldering processes as well as PCB solder joints during the return transport. This gain in effectiveness for users is enabled by the OptiCon THT-Line system’s integration opportunity before the wave soldering oven. Test of LTE Signaling with IMS Functions, Audio and Video Quality23 January 2013 – Anritsu has made available a new extension to its Rapid Test Designer (RTD) solution that offers engineers a single supplier solution for testing LTE signaling with IMS functions, audio and video quality. The extension to RTD provides the fastest and most flexible way to test Rich Communications Services (RCS) on LTE devices during development. The unique test creation environment enables engineers to create tests 5-10 times faster than when using a traditional scripting language. Inline Programming System combined with Embedded Test22 January 2013 - GOEPEL electronic introduced additional RAPIDO series inline production systems for high-speed programming as well as board test based on the newest Embedded System Access (ESA) technologies. The new models named RPS3000-(x) support double-sided probing for up to 3000 nails. Non-volatile memories such as Flash, Microcontrollers (MCU) and Programmable Logic Devices (PLD) can be on-board programmed even faster and more reliably. 32 Gb/s Multi-Channel Bit Error Rate Testers for 100G Networks18 January 2013 – Tektronix announced a new series of high-speed pattern generators and error detectors to support optical and serial data communications testing on signals as fast as 32 Gb/s. The new PPG3000 Series Pattern Generators and PED3000 Series Bit Error Detectors feature multi-channel pattern generation with channel-specific data programming ideal for critical margin testing on critical standards like 100G Ethernet, which require up to 4 channels. Inline Optical Inspection of double-sided assembled PCBs17 January 2013 - Prueftechnik Schneider & Koch presents a new inline AOI system. The LaserVision Twin inspects both sides of double-sided assembled PCBs and THT solder joints at the same time during the ongoing production process. For completely linked production lines as well as for manufacturing cells, this method is particularly time-, handling- and cost-efficient. Versatile Contacting Solution for Assembly Test16 January 2013 - GOEPEL electronic introduced G-TAP, a worldwide unique solution for the versatile contacting of electronic assemblies – in particular the JTAG bus – for testing and programming. The G-TAP is not a single product but an overall concept, because the module can be utilized in stand-alone operations as well as an integrated solution in existing electronic and optical test systems such as Flying Probers, In-Circuit Test or AOI systems. More Articles ...
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