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Readers Top 5 News of last 30 days
News - Board and System TestVi TECHNOLOGY strengthens support in Germany29 April 2015 - Vi TECHNOLOGY, a provider of inspection solutions for PCB assembly, announced the establishment of Vi TECHNOLOGY GmbH, a wholly-owned subsidiary in Germany. The Vi TECHNOLOGY German Applications and Training Center opened in October 2014 in close proximity to Munich, has already proven to be a strong base to serve the company's German speaking customers. Flexible Test-Handler for In-Circuit and Functional Test29 April 2015 - In-Circuit- or functional test as well as programming processes can be inline automated with IPTE’s new Easy-Test-Handler ETH. The ETH is practical for the use with single-circuit boards, multiple boards or corresponding carriers for circuit boards. Both, one- or double-sided fixtures can be realized. The fixtures can be changed quickly and easily. For optional parallel use of more than one Test-Handler, the Test-Handler can be equipped with a bypass-segment. This allows a constant production process, which is not interrupted by the testing process. Moreover, the Bypass can be used to optimize the cycle time. Debug and Hardware Validation Tools for Intel Broadwell-DE Microarchitecture24 April 2015 – Engineers designing microserver and other hyperscale workload systems based on the new Intel microarchitecture codenamed Broadwell-DE will be able to quickly debug software and validate high-speed communications interconnects with ASSET InterTech’s SourcePoint and ScanWorks platforms. The first generation of the Intel Xeon Processor D family is based on the microarchitecture previously referred to as Broadwell-DE. Testing non-scannable Partitions with Boundary Scan21 April 2015 - GOEPEL electronics adds a next generation mixed signal I/O module to the JTAG/Boundary Scan hardware platform SCANFLEX. The new SFX-5296LX offers a powerful solution to make even non-scannable partitions testable through boundary scan. This, for example, allows testing of assemblies with just one Boundary Scan IC. The SFX-5296LX is equipped with diverse dynamic test resources for each channel, such as a frequency counter, an event detector, an arbitrary waveform generator and digitizer. Multistandard Test Solution for Bluetooth Prequalification20 April 2015 - The R&S CMW500 wideband radio communication tester of Rohde & Schwarz supports all 38 RF signaling tests designed by the Bluetooth SIG while providing test capability for other cellular and non-cellular standards as well. Thanks to its particularly fast spectrum measurements, the platform helps users optimize their designs. XJTAG releases Update for JTAG Software17 April 2015 – XJTAG, a supplier of boundary scan technology, announced the release of the latest update to its software suite. The focus of this release is on increasing the flexibility of JTAG chain control to make it easier for engineers to access the full JTAG capabilities of their boards and so achieve maximum test coverage. Dynamic chain profiling makes it easier to initialise boards with multiple JTAG chains, in which a device in one JTAG chain controls power supplies or reset lines for JTAG devices in the other chains. Test Solution for in Vehicle Emergency Call Systems supports ERA GLONASS16 April 2015 - Effective January 1, 2015, all new car models introduced to the Russian market must be equipped with the automatic ERA GLONASS emergency call system. Rohde & Schwarz offers a standard compliant test solution for manufacturers and suppliers of these in vehicle systems. The ERA-GLONASS test setup consists of the R&S CMW500 wideband radio communication tester and R&S SMBV100A vector signal generator as a global navigation satellite system (GNSS) simulator. More Articles ...
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