|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Board and System Test
Cost-Effective Elevated Temperature Surface Characterization23 April 2014 ― Microtronic offers Akrometrix LLC’s CXP, the latest surface measurement equipment platform powered by Studio Software. The CXP addresses EMS and PCB market needs for affordable surface characterization of PCB local areas under reflow conditions. The capabilities of the CXP tool make it a cost-effective solution for EMS and PCB companies to apply the new IPC 9641 standard, concerning warpage measurement of PCB surface mount regions. For 20 years Akrometrix has supported the electronics Industry through services and products that measure the warpage of packages used in surface mount assemblies. While this has been crucial for product yield and reliability, warpage of PCB land areas has typically not been fully understood. The recently finalized IPC 9641 industry standard brings to the forefront the need for warpage measurement to be performed on the PCB side of surface mount assemblies. According to David Markovich, Vice President of Sales and Business Development at Akrometrix, “The CXP is based on Fringe Projection technology patented at the Georgia Institute of Technology, which has some distinct advantages over shadow moiré in terms of product cost, while delivering appropriate measurement resolution. Considering the competitive margins in the EMS and PCB industries, Akrometrix now has a cost-effective solution for these companies to meet the new IPC 9641 standard.” Warpage results collected with the CXP from PCB land areas can be compared to corresponding component warpage through the use of the Akrometrix Interface Analysis software solution, which enables shape matching and interconnect gap analysis at critical temperatures throughout a reflow cycle.
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |