|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Board and System Test
Multi-Channel PXI-based LTE/LTE-Advanced Test Solution22 August 2014 - Keysight Technoligies (Agilent Technologies) announced the LTE/LTE-Advanced multi-channel PXI-based test solution, which accelerates the setup of multi-channel test system configurations and enables engineers to gain deeper insight into complex carrier aggregation and spatial multiplexing MIMO designs. Designing and characterizing components and RF subsystems for base stations, microcells, picocells, repeaters and mobile devices is becoming more complex as multi-antenna designs require increasingly complex multi-channel test configurations. Keysight’s new test solution provides tools to generate complex LTE/LTE-A multi-channel/MIMO waveforms and analyze multiple channels in the frequency and modulation domains simultaneously. The easy-to-use graphical user interface shortens the time it takes to set up a test configuration. In addition, measurement setups are optimized for LTE/LTE-Advanced MIMO and carrier aggregation configurations. The test solution’s chassis backplane trigger tool configures and routes the backplane triggers for proper time synchronization in MIMO configuration for up to two PXIe chassis. Time-synchronized MIMO testing (2x2 or 4x4) is easily accomplished using Keysight’s RF M9381A PXIe vector signal generators and M9391A PXIe vector signal analyzers, which provide less than 0.38% EVM and less than 20 nsec time synchronization between channels. In addition, the up to 160 MHz signal generation and analysis bandwidth is capable of supporting the widest LTE-Advanced carrier aggregation applications. Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |