|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Board and System Test
NI Collaborates with CROWD to define 5G Wireless Communications21 November 2014 – National Instruments (NI) announced its collaboration with CROWD, the European Union Framework Project 7 (EU FP7), to define next-generation wireless 5G communications. CROWD researches the combination of small- and large-density cells in a heterogeneous wireless network for an efficient architecture in which small cells meet traffic hot-spot needs while large cells offer reliable coverage for high-mobility users. “Current demand is barely supported by existing network infrastructure, so we need higher points of dense networks,” said James Kimery, director of RF, communications and software defined radio for NI. “However, network densification requires advanced self-organized network techniques to manage interference. The goal of CROWD is to develop higher layer algorithms to manage increased complexity due to densification.” NI, one of seven collaborators in the CROWD consortium, leads the testbed activities within the EU FP7 CROWD research project in the domain of future communication and ICT services infrastructures. An NI PXI chassis running FlexRIO FPGA modules, NI 5791 RF front-end modules and LabVIEW system design software provides the infrastructure for an LTE/WiFi testbed for conducting experiments to showcase software defined networking concepts proposed by various partners in the project. Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |