This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  

Newsletter

Register to our newsletter
Every two weeks -
all news at a glance
captcha 

News - Board and System Test

Flexible Test-Handler for In-Circuit and Functional Test

IPTE ETH29 April 2015 - In-Circuit- or functional test as well as programming processes can be inline automated with IPTE’s new Easy-Test-Handler ETH. The ETH is practical for the use with single-circuit boards, multiple boards or corresponding carriers for circuit boards. Both, one- or double-sided fixtures can be realized. The fixtures can be changed quickly and easily. For optional parallel use of more than one Test-Handler, the Test-Handler can be equipped with a bypass-segment. This allows a constant production process, which is not interrupted by the testing process. Moreover, the Bypass can be used to optimize the cycle time.

The IPTE Easy-Test-Handler ETH is an economical test solution with compact footprint. The Easy Test Handler integrates easily in a fully automated SMEMA-compatible test environment and provides enough space for 19 inch-Test-Equipment (10 HE). The integrated LC-touch display gives access to all parameters and settings.

www.ipte.com/



Related Articles:

Upcoming Events

Embedded World 2024
Nuremberg (Germany)
09 to 11 April
Control 2024
Stuttgart (Germany)
23 to 26 April
Automotive Testing Expo Europe 2024
Stuttgart (Germany)
04 to 06 June

  More events...
  See our Trade Show Calendar
  Click here